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  • 1
    Electronic Resource
    Electronic Resource
    Precision analysis and low-light-level measurements using a prototype four-detector photopolarimeter (FDP) (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2063-2068 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A given uncertainty of the output current vector of the FDP leads to a corresponding uncertainty in the determination of the Stokes vector of incident light. Using an FDP instrument matrix measured free from imperfections in the calibration optics, and for a preset level of error for each current, the root-mean-square errors (RMSE) of the three normalized Stokes parameters (NSPs) are calculated as functions of the state of polarization of an assumed totally polarized incident beam. Experimental results are also presented that show the effect of reducing the power level of a light beam (from ∼0.2 mW to 〈60 nW, an attenuation range of 35 dBs) on the precision with which the NSPs are measured. The RMSE of each NSP is virtually independent of attenuation over an initial range of two decades and rises subsequently. However, it is the digitization (or quantization) error of the 12-bit analog-to-digital converter that sets the limit on precision in our FDP. The accuracy with which the NSPs are measured is also essentially independent of light level, provided that the adjusted operational-amplifier gains are correctly accounted for. The ability of our prototype FDP to resolve small changes of the state of polarization of light is tested directly by introducing known deliberate perturbations around several input states. Polarization states that are separated by 0.1° on the Poincaré sphere are found to be resolvable with an uncertainty of ∼0.03°.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141418
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  • 2
    Electronic Resource
    Electronic Resource
    An arrangement of two reflective photodetectors for measuring all four Stokes parameters of light (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2080-2082 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A folded-path two-detector photopolarimeter for measuring all four Stokes parameters of light is described. The light beam, whose state of polarization is to be measured, strikes the two (windowless and reflective) detector surfaces at oblique incidence and with noncoincident planes of incidence. After reflection from the second detector, the beam is folded back on itself by a mirror and the feedback is interrupted periodically with a light chopper. This intermittent feedback causes square-wave modulation of the two detector outputs which provides a 4×1 current vector I. The unknown 4×1 Stokes vector S of incident light is determined by S=A−1 I, where A is a wavelength-dependent 4×4 instrument matrix which is fixed by calibration. Based on an explicit expression for det A, all potential singularities of A are investigated and are found to be readily avoidable. Optimum parameters are also specified that make A as far from singular as possible by maximizing its determinant.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142370
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  • 3
    Electronic Resource
    Electronic Resource
    Polarization Michelson interferometer as a global polarization state generator and for measurement of the coherence and spectral properties of quasimonochromatic light (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2834-2837 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: For a quasimonochromatic light source with a known spectrum, the polarization Michelson interferometer (POLMINT) can be used as a global polarization state generator that produces totally or partially polarized light at its output in states of known degree of polarization that correspond to points on and within the Poincaré sphere. Conversely, the spectral and coherence properties of a quasimonochromatic source can be determined from the Stokes parameters of light at the output of the POLMINT measured by a complete polarization state detector as functions of a mirror displacement. Applications of the POLMINT as an ellipsometer are also discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144370
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  • 4
    Electronic Resource
    Electronic Resource
    Real-time adsorption/desorption thin-film optical monitor using a windowless reflective silicon photodetector (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4362-4366 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A thin-film deposition monitor is described that employs a windowless reflective Si photodetector as the sensing element. When the detector is illuminated by a monochromatic light beam at oblique incidence, the generated photoelectric signal becomes a sensitive function of the thickness and refractive index of the deposited film. For high sensitivity, the incident light is linearly polarized perpendicular to the plane of incidence, and an angle of incidence (approximately-greater-than)60° is used. Further, the passivation SiO2 layer thickness is also judiciously selected for this application. A sensor of this kind is employed to follow the adsorption/desorption kinetics of an H2O film at the detector surface (at 633 nm wavelength) and the results are interpreted with the help of Bruggeman's effective medium theory. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145328
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  • 5
    Electronic Resource
    Electronic Resource
    Calibration and testing of a sixteen-beam grating-based division-of-amplitude photopolarimeter (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5552-5558 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Results for the calibration and testing of a 16-beam grating-based division-of-amplitude photopolarimeter, that take into account the effect of source polarization and imperfections of the polarization state generator, are presented. A model is developed to analyze the elements of the instrument matrix obtained from calibration. The experimental results are compared with the predictions of the model, and useful information is extracted about the optical elements of the system. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146476
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  • 6
    Electronic Resource
    Electronic Resource
    Performance of an automated rotating-detector ellipsometer (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3625-3632 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A computer-controlled rotating-detector ellipsometer (RODE) has been constructed using a windowless planar-diffused Si photodiode, a stepping motor, an operational amplifier, and a personal computer (PC) equipped with an A/D-D/A converter. The detector is mounted to the output shaft of the stepping motor at an optimum angle of incidence of ∼59° and is rotated through 360° about the incident beam as an axis. The detector output signal voltage is measured and stored in the PC at every 2° increment of the RODE angle θ. Fourier analysis of the recorded data provides a handedness-blind determination of the state of polarization of the incident light. A beam from a HeNe laser (λ=632.8 nm) is transmitted through the polarizing optics of an ellipsometer to provide the polarization states needed for calibration and testing. The calibration parameters mL and θr are determined by rotating the detector about a linearly polarized beam of light of zero reference azimuth. The RODE is subsequently tested and found to correctly measure the first two normalized Stokes parameters of a number of states with a residual rms error of ∼0.002. This limit on precision is dictated mainly by the 12-bit A/D converter. A small angular misalignment of the rotation axis of the detector with respect to the light-beam axis introduces odd harmonics in the detector signal; hence, its effect is readily isolated by appropriate data reduction. Thin-film coatings on the detector surface that significantly improve the performance of the RODE are proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140517
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  • 7
    Electronic Resource
    Electronic Resource
    Construction, calibration, and testing of a four-detector photopolarimeter (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 84-88 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A computer-controlled four-detector photopolarimeter (FDP) has been constructed using four windowless planar-diffused Si photodiodes, operational amplifiers, an analog-to-digital (A/D) converter, and a personal computer with peripherals. A nonplanar light path is selected with incidence angles at the first three detectors of ∼65° and with rotations of ∼45° between the successive planes of incidence. The last detector, which is coated for minimum reflectance, intercepts the beam at a small angle and the residual light it reflects is dumped. A 1-mW He–Ne laser beam (λ=632.8 nm) passes through the polarizing optics of an ellipsometer to provide the polarization states needed for calibration and testing. With an optimum set of calibration states, the instrument matrix A is determined. The FDP is subsequently tested and found to correctly measure the normalized Stokes parameters of a large number of states with an average absolute error of ∼0.01, which is attributed to imperfections in the calibration optics. This first prototype instrument has a precision of ∼0.2%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139971
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  • 8
    Electronic Resource
    Electronic Resource
    Two-detector ellipsometer (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1746-1748 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An ellipsometer with two photodetectors and no other optical elements is described. In general, each detector has a partially specularly obliquely reflecting surface and generates an electrical signal proportional to the fraction of radiation it absorbs. It is not essential (but desirable) that the two detectors absorb all of the incident radiation. The output signals of the two detectors, with parallel or nonparallel surfaces, are enough to determine the degree of linear polarization P of incident light with respect to one set of transverse orthogonal axes. If the assembly of two parallel detectors is rotated around the light beam by an angle (of 45°), a new degree of linear polarization P' is measured. From P and P' the (generally elliptic) polarization state of incident totally polarized light can be completely determined, except for handedness. A calibration procedure for this two-detector ellipsometer (TDE) is given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138087
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  • 9
    Electronic Resource
    Electronic Resource
    Chiral thin solid films: Method of deposition and applications (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 3118-3120 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Chiral thin solid films (CTSFs) can be deposited on a solid substrate in vacuum by letting a vapor stream of film material impinge on the substrate at oblique incidence and rotating the substrate during deposition. The direction of substrate rotation determines the handedness of the resulting helical structure which resembles that of a cholesteric or twisted-nematic liquid crystal layer. CTSFs are useful in making new optical rotators and beam splitters that separate the orthogonal circular polarization components of light. A quadrant-detector ellipsometer that uses chiral and achiral obliquely deposited thin films is described for measuring the state of polarization of light.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107979
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  • 10
    Electronic Resource
    Electronic Resource
    Polarization orthogonalization properties of optical systems (1977)
    Springer
    Applied physics 13 (1977), S. 281-285 
    Details
    ISSN: 1432-0630
    Keywords: 42.10
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We investigate the conditions under which an optical system (or device) may transform polarization states at its input into orthogonal states at its output. We find that such polarization orthogonalization is possible if the Jones matrix of the optical system satisfies a specific inequality. One, two, or an infinite number of input polarization states may be orthogonalized. In the latter case, the locus of input states is a circle in the complex plane (and on the Poincaré sphere) of polarization. Several examples are given for illustration.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00882893
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