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  • 1985-1989  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Chemical constitution and microstructure of TiC x coatings chemically vapour deposited on Fe-C substrates; effects of iron and chromium (1988)
    Springer
    Journal of materials science 23 (1988), S. 1660-1672 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract TiC x coatings were chemically vapour deposited in an industrial reactor on Fe-C substrates with carbon contents between 0.06 and 1.20 wt % C. Electron probe microanalyses showed that significant amounts of chromium and iron were present in the coatings and that chromium was also present in the substrate region adjacent to the coatings. By comparing calculated and measured lattice parameters (corrected for the internal stresses present) it became evident that the chromium was in solid solution in TiC x , whereas the iron was not. This was confirmed by micro Auger electron spectroscopy and X-ray diffraction phase analyses. The carbon to metal ratio,x, of the TiC x coatings decreased with increasing distance to the coating/substrate interface. The effect of iron on the X-ray diffraction line broadening and hardness of the coatings was large (in contrast with the effect of chromium) and increased with increasing distance to the coating/substrate interface because of a decreasing iron particle size. The TiC x crystallite size was small and constant throughout the thickness of the coatings. The chromium present in the substrate region adjacent to the TiC x coatings influenced the microstructure of the substrate by formation of iron, chromium-carbides and reduced the growth rate of the coatings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01115705
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Quantitative electron probe microanalysis of carbon in binary carbides. I - principles and procedures (1986)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 135-141 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Introductory investigations performed in order to make quantitative electron-probe microanalysis of very light elements such as boron, carbon, nitrogen or oxygen possible are described. The practical problems encountered in this kind of work are discussed in detail and, where possible, solutions are proposed. It is shown that with very light elements such as carbon it is no longer permitted to measure x-ray intensities at the position of the maximum of the emission peak as the shape of the carbon Kα peak is subject to strong alterations, depending on the type of chemical bond involved. As a consequence, integral measurements have to be performed and it is shown that errors of 30-50% can easily be made if this is neglected. The lengthy procedures, connected with integral intensity measurements, can be shortened considerably by the introduction of area/peak factors, which, by definition, represent the ratio between the correct area (integral) and the peak intensity ratio. The accurate determination of such factors for 13 binary carbides is described. This set of factors will permit future measurements simply on the peak; multiplication of the peak intensity ratio by the appropriate area/peak factors will then yield the correct integral intensity ratios.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300150212
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Quantitative electron probe microanalysis of carbon in binary carbides. IIFor Part I, see p. 135 - data reduction and comparison of programs (1986)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 143-150 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The performances of four current matrix correction programs have been tested on a data file of measurements on 13 binary carbides between 4 and 30 kV. Both the metal lines as well as the carbon Kα line have been measured, which resulted in 145 k ratios for the metals (relative to elemental standards) and 117 integral k ratios for carbon Kα (relative to Fe3C).Evidence is presented that the existing sets of mass absorption coefficients for carbon Kα radiation are perhaps not fully consistent and a new set is therefore proposed, which is in better agreement with the experimental results. Finally, it is shown that the modified Gaussian φ(ρz) approach, when used in conjunction with the new set of mass absorption coefficients, leads to unexpectedly good results, with a relative root-mean-square value of 3.7%. This demonstrates that even for carbon very good accuracy can be obtained, provided that proper care is exercised in the measurements and the proper procedures are followed.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300150213
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    Paper (German National Licenses)
    Fulltext
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