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  • 1
    Electronic Resource
    Electronic Resource
    On the texture in diffusion-grown layers of silicides and germanides with the FeB structure, MeX (Me=Ti, Zr; X=Si, Ge) or the ZrSi2 structure (ZrSi2, HfSi2, ZrGe2) (1984)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 17 (1984), S. 103-110 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In diffusion-grown layers of compounds with the orthorhombic FeB- and ZrSi2-type structures a pronounced texture is present which is rotationally symmetric with respect to the direction of diffusion. In FeB-type structures a [101]-fibre texture is observed for ZrSi and HfSi and a [100]-fan texture for TiSi and ZrGe. In ZrSi2-type compounds the b axis is always perpendicular to the direction of diffusion; different compounds, however, show different textures: a [010]-fan texture for ZrSi2, a [100]-fibre texture for HfSi2 and a 〈101〉-fibre texture for ZrGe2. The textures are explained in terms of preferential diffusion along specific crystallographic directions which can be derived from the crystal structures. At high temperatures a second texture component has been observed in HfSi layers and in layers with the ZrSi2 structure. This second component can be considered as a recrystallization texture and can be derived from the original texture by a rotation of the crystallites of 20–25° around a simple crystallographic direction. The existence of a so-called TiGe phase with the FeB structure in the temperature region 1070–1270 K is questionable. Only Ti6Ge5 has been produced and this compound showed a [001]-fibre texture.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889884011079
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  • 2
    Electronic Resource
    Electronic Resource
    On the layer sequence and morphology in solid-state displacement reactions (1984)
    Springer
    Oxidation of metals 22 (1984), S. 161-180 
    Details
    ISSN: 1573-4889
    Keywords: displacement reactions ; ternary diffusion ; multiphase diffusion ; diffusion path ; Ni-Cu-O ; Co-Cu-O ; Fe-Ni-O ; Fe-Cu-O ; Cu-Ni-S ; Fe-Ni-S ; Cr-Ni-S
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In displacement reactions of the type pA+BqX→qB+ApX, two main forms of the layer sequence have been found in the reaction layer, namely, A/ApX/B/BqX and A/B/ApX/BqX. In this paper it is argued that the thermodynamics of the system, more specifically the dependence of the activity of element X on the mole ratio between the elements A and B, determines the initial layer sequence. Various morphological variants of the two basic types may develop because of the kinetics. The prediction of the layer sequence and morphology made on the basis of this theory has been verified on a number of oxidic and sulfidic systems. It is, however, pointed out that these predictions also can be applied to purely metallic ternary systems and to other types of reactions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00656903
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  • 3
    Electronic Resource
    Electronic Resource
    The use of standards in the quantitative electron probe micro analysis of binary metal systems (1974)
    Springer
    Microchimica acta 62 (1974), S. 617-625 
    Details
    ISSN: 1436-5073
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Für die hier untersuchten binären Metallsysteme hat sich die von Ziebold und Ogilvie angegebene Beziehung als gültig erwiesen. Wie sich zeigen ließ, kann man mehrphasige Legierungen als Eichstandards verwenden, wenn gewisse Voraussetzungen erfüllt sind. In Zusammenhang mit der Langzeit-Instabilität der Mikrosonde kann es sein, daß sich die Konstante der Ziebold-Ogilvie-Kurve mit der Zeit ändert. Es besteht kein Grund zur Annahme, daß diese Instabilität auf das eine benutzte Instrument beschränkt ist. Daher wird empfohlen, ein oder zwei Standardlegierungen zusammen mit dem reinen Bezugsmetall zu verwenden, um jederzeit die Gewähr für einwandfreie Meßergebnisse zu haben. Die Auswirkung der Langzeit-Instabilität kann bei dem üblichen, theoretisch ermittelten Korrekturverfahren nur schwer in Rechnung gestellt werden.
    Notes: Summary For the binary metal systems investigated, the Ziebold-Ogilvie relation has been found to be valid. It has been shown that polyphase alloys may be used as calibration standards if some specific conditions are fulfilled. In connection with a long-term instability of the microprobe apparatus, the Ziebold-Ogilvie constant of the calibration curve may vary with time. There is no reason for assuming that this instability is restricted to the particular instrument used. Therefore it is recommended that one or two standard alloys be used together with the pure reference metal to determine that constant every time concentration measurements have to be performed. The effect of the long-term instability can hardly be taken into account in the usual theoretically-based correction procedures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01218197
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  • 4
    Electronic Resource
    Electronic Resource
    Chemical constitution and microstructure of TiC x coatings chemically vapour deposited on Fe-C substrates; effects of iron and chromium (1988)
    Springer
    Journal of materials science 23 (1988), S. 1660-1672 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract TiC x coatings were chemically vapour deposited in an industrial reactor on Fe-C substrates with carbon contents between 0.06 and 1.20 wt % C. Electron probe microanalyses showed that significant amounts of chromium and iron were present in the coatings and that chromium was also present in the substrate region adjacent to the coatings. By comparing calculated and measured lattice parameters (corrected for the internal stresses present) it became evident that the chromium was in solid solution in TiC x , whereas the iron was not. This was confirmed by micro Auger electron spectroscopy and X-ray diffraction phase analyses. The carbon to metal ratio,x, of the TiC x coatings decreased with increasing distance to the coating/substrate interface. The effect of iron on the X-ray diffraction line broadening and hardness of the coatings was large (in contrast with the effect of chromium) and increased with increasing distance to the coating/substrate interface because of a decreasing iron particle size. The TiC x crystallite size was small and constant throughout the thickness of the coatings. The chromium present in the substrate region adjacent to the TiC x coatings influenced the microstructure of the substrate by formation of iron, chromium-carbides and reduced the growth rate of the coatings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01115705
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  • 5
    Electronic Resource
    Electronic Resource
    Evaluation of the use of Gaussian φ(ρz) curves in quantitative electron probe microanalysis: A new optimization (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 91-97 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A computer program based on the use of Gaussian expressions for the x-ray distribution with depth [φ(ρz)curves] was tested on its usefulness for quantitative electron probe microanalysis. As the good results originally claimed for a similar program could not be reproduced initially, it was subjected to a detailed analysis. As a result, some modifications in the approach are proposed. Apart from increasing the speed of calculation considerably, the modified expressions provide a better insight into the delicate balance which has to exit between the relevant quantities involved. After a new optimization process the modified program was tested on about 450 published microanalyses. The results show that the φ(ρz) approach is indeed very promising as a narrow histogram with an r. m. s. value of 5. 4% could be produced. Finally, some suggestions are made for future improvements.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130211
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  • 6
    Electronic Resource
    Electronic Resource
    Quantitative electron probe microanalysis of carbon in binary carbides. I - principles and procedures (1986)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 135-141 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Introductory investigations performed in order to make quantitative electron-probe microanalysis of very light elements such as boron, carbon, nitrogen or oxygen possible are described. The practical problems encountered in this kind of work are discussed in detail and, where possible, solutions are proposed. It is shown that with very light elements such as carbon it is no longer permitted to measure x-ray intensities at the position of the maximum of the emission peak as the shape of the carbon Kα peak is subject to strong alterations, depending on the type of chemical bond involved. As a consequence, integral measurements have to be performed and it is shown that errors of 30-50% can easily be made if this is neglected. The lengthy procedures, connected with integral intensity measurements, can be shortened considerably by the introduction of area/peak factors, which, by definition, represent the ratio between the correct area (integral) and the peak intensity ratio. The accurate determination of such factors for 13 binary carbides is described. This set of factors will permit future measurements simply on the peak; multiplication of the peak intensity ratio by the appropriate area/peak factors will then yield the correct integral intensity ratios.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300150212
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  • 7
    Electronic Resource
    Electronic Resource
    Quantitative electron probe microanalysis of carbon in binary carbides. IIFor Part I, see p. 135 - data reduction and comparison of programs (1986)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 143-150 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The performances of four current matrix correction programs have been tested on a data file of measurements on 13 binary carbides between 4 and 30 kV. Both the metal lines as well as the carbon Kα line have been measured, which resulted in 145 k ratios for the metals (relative to elemental standards) and 117 integral k ratios for carbon Kα (relative to Fe3C).Evidence is presented that the existing sets of mass absorption coefficients for carbon Kα radiation are perhaps not fully consistent and a new set is therefore proposed, which is in better agreement with the experimental results. Finally, it is shown that the modified Gaussian φ(ρz) approach, when used in conjunction with the new set of mass absorption coefficients, leads to unexpectedly good results, with a relative root-mean-square value of 3.7%. This demonstrates that even for carbon very good accuracy can be obtained, provided that proper care is exercised in the measurements and the proper procedures are followed.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300150213
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  • 8
    Electronic Resource
    Electronic Resource
    Progress in Electron Probe Microanalysis (1990)
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 21 (1990), S. 90-92 
    Details
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/mawe.19900210210
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