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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 4412-4416 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Stability and formation kinetics of TiN and silicides in Ti/Si3N4 and TiN/Si diffusion joints have been investigated. Reactions in the diffusion couples were studied experimentally in the temperature range between 950 and 1100 °C. Isothermal sections and activity diagrams of the Ti-Si-N system were calculated using the recent thermodynamic data. Both the thermodynamic calculations and experimental results indicate that TiN and Si react with each other and form TiSi2 and even Si3N4 if the activity of nitrogen is high enough. Similarly, results from the Ti/Si3N4 couple were in good accordance with calculated phase equilibria. The experiments carried out in vacuum ampoules and in a vacuum furnace showed that the gas phase has a strong effect on the reactions. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 17 (1984), S. 103-110 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In diffusion-grown layers of compounds with the orthorhombic FeB- and ZrSi2-type structures a pronounced texture is present which is rotationally symmetric with respect to the direction of diffusion. In FeB-type structures a [101]-fibre texture is observed for ZrSi and HfSi and a [100]-fan texture for TiSi and ZrGe. In ZrSi2-type compounds the b axis is always perpendicular to the direction of diffusion; different compounds, however, show different textures: a [010]-fan texture for ZrSi2, a [100]-fibre texture for HfSi2 and a 〈101〉-fibre texture for ZrGe2. The textures are explained in terms of preferential diffusion along specific crystallographic directions which can be derived from the crystal structures. At high temperatures a second texture component has been observed in HfSi layers and in layers with the ZrSi2 structure. This second component can be considered as a recrystallization texture and can be derived from the original texture by a rotation of the crystallites of 20–25° around a simple crystallographic direction. The existence of a so-called TiGe phase with the FeB structure in the temperature region 1070–1270 K is questionable. Only Ti6Ge5 has been produced and this compound showed a [001]-fibre texture.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 91-97 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A computer program based on the use of Gaussian expressions for the x-ray distribution with depth [φ(ρz)curves] was tested on its usefulness for quantitative electron probe microanalysis. As the good results originally claimed for a similar program could not be reproduced initially, it was subjected to a detailed analysis. As a result, some modifications in the approach are proposed. Apart from increasing the speed of calculation considerably, the modified expressions provide a better insight into the delicate balance which has to exit between the relevant quantities involved. After a new optimization process the modified program was tested on about 450 published microanalyses. The results show that the φ(ρz) approach is indeed very promising as a narrow histogram with an r. m. s. value of 5. 4% could be produced. Finally, some suggestions are made for future improvements.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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