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  • 1980-1984  (4)
  • 1970-1974  (8)
  • 1950-1954  (6)
  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 16 (1983), S. 171-175 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Electron microdiffraction patterns have been obtained from regions of diameter about 15 Å in thin crystals of stainless steel containing twin boundaries and stacking faults. The diffraction spots show splittings which are characteristic of the type of defect present as a result of interference effects in the coherent convergent electron beam. The observations of spot splitting are in good agreement with calculations based on simple theoretical models. In conjunction with previous work on antiphase domain boundaries [Zhu & Cowley (1982). Acta Cryst. A38, 718–724] these results suggest that the observation of spot splitting is of general relevance for the study of all planar faults in thin crystals.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 3 (1970), S. 49-59 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The use of scanning electron microscopy for the study of thin specimens by transmission has advantages over conventional transmission electron microscopy in terms of simplicity and cheapness, reduction in damage to irradiation-sensitive specimens and convenience for electron diffraction, energy analysis and the electronic measurement and recording of images. These advantages are specially important for microscopes operating in the range 200 kV to 1 MeV. The design of a 600 kV instrument to exploit these advantages is described. The possible modes of operation employing deflexion systems and an energy analyser are discussed with reference to light- and dark-field microscopy, convergent beam diffraction and conventional focused diffraction patterns. The reciprocity principle is invoked to relate both image contrast and instrument design in scanning electron microscopy to that in conventional transmission electron microscopy. Examples are given of light- and dark-field images and diffraction patterns obtained with the instrument.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 4 (1971), S. 482-487 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Wide-angle convergent-beam electron diffraction patterns from thin single crystals show sets of parallel lines somewhat similar to Kikuchi or Kossel lines. In some cases, each line separates into a black and white line pair when the electron beam is defocused. It is shown that this separation depends on the curvature of the crystal. A method for analysis of the line geometry is proposed which takes into account the aberrations of the electron lens. Using a high-voltage transmission scanning electron microscope, through-focus series of patterns from graphite crystals have been obtained and analyzed to give values for the radius of curvature of the crystal. In defocussed patterns the distortions of the lattice by defects are clearly visible.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 38 (1982), S. 718-724 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Electron diffraction patterns have been obtained from regions of a thin crystal of partially ordered copper-gold alloy, Cu3Au, which have a diameter of about 15 Å and contain an antiphase domain boundary. The superlattice diffraction spots show a characteristic splitting similar to the splitting which appears in all spots, both fundamental and superlattice, when the beam irradiates a region at the edge of a crystal. By observing which of the superlattice spots are split and which are not, it is possible to deduce immediately whether the antiphase domain boundary is of the 'good' type or is one of the 'bad' types or whether more than one boundary is illuminated by the beam. The observations of split spots are in good agreement with the results of calculations made on the basis of kinematic theory. It is shown that these results remain valid in the presence of strong dynamical scattering for small specimen thicknesses.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: An earlier report [Acta Cryst. (1977), A33, 681-684] by a joint IUCr-IMA committee on the nomenclature of polytypism has been revised and extended. Two kinds of symbolism are recommended for use with either simple or complicated polytypic structures. The first consists of 'indicative symbols' in a modified Gard notation, the second of 'descriptive symbols' based on earlier proposals by Dornberger-Schiff, Durovic and Zvyagin. The polytypism of ZnS and SrGeO3 provides examples for the use of descriptive symbolism.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 27 (1971), S. 376-383 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The structure of the disordered (high-temperature) phase of titanium monoxide has been studied by electron diffraction. Composition-dependent complex distributions of diffuse scattering are observed and interpreted in terms of short-range-ordered configurations of lattice vacancies. The proposition that the form of the diffuse scattering may correspond to ordering under the influence of long-range electronic energy terms and so show a direct relationship to the topology of the Fermi surface is examined.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 6 (1953), S. 516-521 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 6 (1953), S. 522-529 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 6 (1953), S. 846-853 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 26 (1970), S. 152-153 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: In the BJR theory of electron diffraction an absorption effect due to weak beams is introduced into the two-beam approximation for the dynamical diffraction of electrons by thick crystals. This is shown to be unjustified for diffraction from perfect crystals. The use of the theory to derive the temperature dependence of diffraction intensities must therefore be modified.
    Type of Medium: Electronic Resource
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