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  • 1980-1984  (4)
  • 1960-1964
  • 1870-1879
  • Chemistry  (3)
  • Endosperm  (1)
  • 1
    ISSN: 1432-2242
    Schlagwort(e): Wheat ; Endosperm ; Proteins ; Electro phoresis
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Biologie
    Notizen: Summary The major endosperm proteins in a range of genotypes of hexaploid wheat have been fractionated by two-dimensional electrophoresis. The genotypes included nine varieties and forty four intervarietal substitution lines in which chromosomes 1A, 1B, 1D, 6A, 6B or 6D from eight of the varieties have been introduced one at a time into a common genetic background. The appearance of different protein subunits was often correlated with a chromosome substitution. This showed that many of the genes for the high molecular weight protein subunits (molecular weight range 55,000 to 140,000 determined by SDS polyacrylamide gel electrophoresis) are specified by chromosomes 1A, 1B and 1D while many of the lower molecular weight subunits (molecular weight range 30,000 to 45,000) are specified by chromosomes 6A, 6B and 6D. The different protein subunits correlated with chromosome substitution could not always be recognised in the varietal source of the substituted chromosome. The different subunits specified by homologous chromosomes in different wheat varieties may differ in isoelectric point and/or molecular weight.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 153-153 
    ISSN: 0049-8246
    Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 138-146 
    ISSN: 0049-8246
    Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: It is shown that the depth distribution of X-ray production in the electron microprobe can be accurately described by a Gaussian modified at the sample surface by a transient. Assuming that the Gaussian is a consequence of the electrons undergoing a random walk in the sample and that the transient corresponds with the change from collimated to random electron trajectories enables theoretical values for the amplitudes and coefficients of the two functions to be predicted. There is excellent agreement between the predicted and the observed values. The Lenard coefficient and the electron range can both be estimated from the coefficient in the Gaussian. It is suggested that for microprobe work, Lenard's law for electron absorption be replaced by this revised law. Both the absorption and atomic number corrections of the traditional ZAF approach are replaced by the new function.
    Zusätzliches Material: 14 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 4
    Digitale Medien
    Digitale Medien
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 187-193 
    ISSN: 0049-8246
    Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The Gaussian expression for φ(ρz) has been used as the basis of a computer program for quantitative electron probe microanalysis. Corrections for absorption and atomic number are combined within the expression for φ(ρz) whereas the fluorescence correction is based on numerical integration over the primary and secondary intensities. Error histograms based on about 500 published analyses of standard specimens have been used to adjust the parameters in the Gaussian expression for optimum accuracy. The resultant error histograms are as narrow as those obtained for the most accurate of the current ZAF correction procedures. Extension of the method to non-normal electron incidence is relatively straightforward.
    Zusätzliches Material: 6 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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