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  • 34.80.G  (3)
  • 35.20  (3)
  • Ionization cross section  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Absolute partial and total electron ionization cross sections for CCl4 from threshold up to 180 eV (1984)
    Springer
    Plasma chemistry and plasma processing 4 (1984), S. 235-249 
    Details
    ISSN: 1572-8986
    Keywords: Ionization cross section ; electron impact ; mass spectrometry
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Electron impact ionization of carbon tetrachloride was studied as a function of electron energy from threshold up to 180 eV. A double-focusing mass spectrometer system in combination with an improved electron impact ion source was used, alleviating the problems of ion extraction from the source and the transmission of the extracted ions through the mass spectrometer system. Absolute partial ionization cross sections for the occurrence of CCl 3 + , CCl 2 + , CCl+, Cl 2 + , Cl+, C+, CCl 3 2+ , and CCl 2 2+ have been determined. In addition, the total ionization cross-section function of CCl4 is reported and compared with theoretical predictions based on a classical binary encounter approximation. Using nth root extrapolation the following ionization energies of the doubly ionized fragment ions have been derived: AE(CCl 3 2+ )=30.4±0.3 eV; and AE (CCl 2 2+ )=31.8±0.3 eV. In accordance with theoretical predictions and previous results, no stable CCl 4 + has been detected, however, metastable dissociation processes CCl 4 + → CCl 3 + have been observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00568978
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Observation and investigation of metastable decay series of (N2) n + cluster ions (1989)
    Springer
    The European physical journal 12 (1989), S. 285-287 
    Details
    ISSN: 1434-6079
    Keywords: 36.40 ; 34.80.G
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract N2 cluster ions are produced by electron impact ionization of a supersonic N2 cluster beam and analyzed with a double focussing sector field mass spectrometer. It is found that metastable N2 cluster ions lose more than one N2 molecule in the μs time regime and decay predominantly via sequential series (N2) n + *→(N2) n−1 + *→...→N 2 + , evaporating a single monomer in each of these successive decay steps. The metastable decay rates determined in detail for cluster sizes 2≤n≤6 andn=20 lie between 1 and 106s−1. These rates(i) depend strongly on the time elapsed after ion formation and on the respective parent cluster ion size, and(ii) exhibit a quasiperiodic pattern in magnitude.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01426957
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Production and properties of CO2 cluster anions (1992)
    Springer
    The European physical journal 24 (1992), S. 289-296 
    Details
    ISSN: 1434-6079
    Keywords: 36.40.+d ; 35.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Stoichiometric and non-stoichiometric negatively charged CO2 cluster ions have been produced in a crossed neutral cluster/electron beam ion source. The abundance and stability of these ions have been studied with a double focussing sector field mass spectrometer. The observed abundance anomalies (“magic numbers”) in the mass spectra of (CO2) n − and (CO2) n O− ions correlate with corresponding small and large metastable fractions of these ions (for loss of one CO2 unit). Variation of the measured metastable fractions as a function ofn are related to corresponding changes in the monomer binding energies. In addition, we have observed for the first time (CO2) n O 2 − ions (i.e. at electron energies above 8 eV with an energy resonance at about 14 eV) and we discuss possible production mechanisms for these ions. Relative electron attachment cross sections have been determined in the energy regime O〈E≦20 eV for (CO2) n − , (CO2) n O− and (CO2) n O 2 − withn=1 to 20. The shape of the cross section function for (CO2) n O− is strongly dependent on the cluster sizen.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01425751
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  • 4
    Electronic Resource
    Electronic Resource
    Metastable decay of rare gas cluster ions: mechanism and kinetics (1989)
    Springer
    The European physical journal 12 (1989), S. 263-267 
    Details
    ISSN: 1434-6079
    Keywords: 36.40 ; 34.80.G
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Metastable decay of cluster ions has been discovered only recently. It was noted that one has to take this metastable decay into account when using mass spectrometry to probe neutral clusters, because ion abundance anomalies in mass spectra of rare gas and molecular clusters are caused by delayed metastable evaporation of monomers following ion production. Moreover, it was found that(i) the individual metastable reaction rates k depend strongly on cluster size and cluster ion production pathways and that(ii) there exists experimental evidence (k=k(t)) and a theoretical prediction that a given mass selected cluster ion generated by electron impact ionization of a nozzle expansion beam will comprise a range of metastable decay rates. In addition, it was discovered that metastable Ar cluster ions which lose two monomers in the μs time regime decay via sequential decay series Ar n + *→Ar n−1 + *→Ar n−2 + * with cluster sizes 7≤n≤10 andn=3 (similar results were obtained recently in case of N2 cluster ions). Conversely, the dominant metastable decay channel of Ar 4 + * into Ar 2 + was found to proceed predominantly via a single step fissioning process.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01426951
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  • 5
    Electronic Resource
    Electronic Resource
    Interactions of electrons with SF6: ionization and attachment (1989)
    Springer
    The European physical journal 12 (1989), S. 303-305 
    Details
    ISSN: 1434-6079
    Keywords: 36.40 ; 34.80.G
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Electron attachment and electron impact ionization of SF6 clusters have been investigated quantitatively in a molecular beam/electron ion source/mass spectrometer system as a function of electron energy E (0≤E≤180 eV) and as a function of cluster size.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01426962
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Ion attachment to Van der Waals clusters (1993)
    Springer
    The European physical journal 26 (1993), S. 210-212 
    Details
    ISSN: 1434-6079
    Keywords: 36.40 +d ; 35.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Mixed ionized clusters have been produced in a supersonic nozzle beam experiment by attachment of stagnant cations (i.e. NO+ and Xe+) to neutral van der Waals clusters (i.e.Ar n ) within a Nier type ion source. This new ionization technique leads to less fragmentation than electron impact ionization and the measured cluster distributions exhibit icosahedral shell and subshell closures which have not been detected in the case of electron impact of Ar n -clusters ionization so far. Additionally, the obtained appearance energies and metastable fractions give insight into the production mechanism and the stability of the resulting ions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01429147
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    Electron attachment to SO2 clusters (1987)
    Springer
    The European physical journal 6 (1987), S. 351-362 
    Details
    ISSN: 1434-6079
    Keywords: 36.40 ; 35.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Electron attachment to SO2 clusters formed by nozzle expansion was investigated (n up to 8) in a molecular-beam electron-ionization mass-spectrometer system. Electron ionization of SO2 clusters was also studied (n up to 18) showing no pronounced structure in the mass spectra and no strong dependence on electron energy, the dominant positive ion being the (SO2) n + series. Also present but less abundant are the fragment ion series (SO2) n SO+, (SO2) n S+ and (SO2) n O+ with decreasing intensities in that order. The dominant negative ion is (SO2) n − . The homologous series (SO2) n O− and (SO2) n SO− are less abundant, the series (SO2) n S− has not been observed at all (except SO2·S− produced in the background gas via secondary processes). The negative ion mass spectra show a strong dependence on electron energy due to a rich resonance like structure of the attachment cross sections involved. These attachment cross sections have been determined (up to 40 eV) and they show significant differences for the different homologous series. The most striking feature is that for instance (SO2) n SO− ions do not show any signal at the first main resonance of SO− from SO2. Likewise (SO2) n O− ions only show a strongly diminished signal at the first main resonance of O− from SO2. This is in contrast to results in O2, CO2 and N2O. Conversely, (SO2) n − ions show — besides peaks at the position of the first and second O− resonance — additional resonances below and above these peaks. In addition, (SO2) 5 − and larger ones show a zero energy peak consisting of stoichiometric SO2 cluster ions similar to observations in O2, CO2 and H2O. The attachment cross section of S− from SO2 has been found to show an additional previously undetected peak at ∼1 eV. Moreover, the present study revealed the existence of a S n − (n up to 8) series being produced with nearly zero energy electrons via volume and surface processes in and around the ion source.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01437062
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