Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 60 (1995), S. 507-512 
    ISSN: 1432-0649
    Keywords: 42.70 ; 81.40 ; 61.80
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We report on persistent spectral hole-burning and fluorescence-excitation spectroscopy in heavy-dose (3 × 1020 n/cm2) neutron-irradiated and annealed sapphire using a Ti:Sapphire ring laser in single-frequency and broad-band operation. The optimum conditions for hole burning were obtained after annealing the crystals to 400 °C. Holes have been detected in the near-infrared spectral range between 745 and 795 nm. At 1.5 K, the narrowest hole widths were approximately 2 GHz, so that about 104 holes can be burnt in this spectral region. Besides the storage density in the wavelength dimension, the coefficient describing the electric-field-induced filling of a spectral hole also rises by more than one order of magnitude as compared to crystals with low neutron-irradiation dose.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 38 (1985), S. 49-56 
    ISSN: 1432-0630
    Keywords: 66.30 ; 82.65
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Thin layers of GaAs are heavily doped locally by laser induced Se or Zn diffusion. H2Se or diethylzinc gases are used to provide Se or Zn dopant atoms. The surface is locally heated with 3 ns light pulses from a Q-switched frequency doubled Nd-YAG laser. The doping process is described in detail. Doping profiles and sheet carrier concentrations are measured as a function of substrate temperature, laser fluence and processing time. Dopant concentrations of more than 1021 cm−3, with a thickness of the doped layer of less than 20 nm can be achieved.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...