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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 88 (1984), S. 2531-2534 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 88 (1984), S. 2525-2530 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7275-7287 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report fundamental changes of the radiative recombination in a wide range of n-type and p-type GaAs after diffusion with the group-I element Li. These optical properties are found to be a bulk property and closely related to the electrical conductivity of the samples. In the Li-doped samples the radiative recombination is characterized by emissions with excitation-dependent peak positions which shift to lower energies with increasing degree of compensation and concentration of Li. These properties are shown to be in qualitative agreement with fluctuations of the electrostatic potential in strongly compensated systems. For Li-diffusion temperatures above 700–800 °C semi-insulating conditions with electrical resistivity exceeding 107 Ω cm are obtained for all conducting starting materials. In this heavy Li-doping regime, the simple model of fluctuating potentials is shown to be inadequate for explaining the experimental observations unless the number of charged impurities is reduced through complexing with Li. For samples doped with low concentrations of Li, on the other hand, the photoluminescence properties are found to be characteristic of impurity-related emissions.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 89 (1988), S. 1215-1218 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The observation of an anomaly in the optical luminescence excitation spectrum of oxygen in the region of the oxygen K edge is reported. Dispersed luminescence spectra were obtained for x-ray excitation at the pi and sigma resonances, at the anomaly, and in the continuum. These spectra indicate enhanced production of O2+2 ions at both the sigma resonance and at the anomaly. The anomaly thus is attributed to a shake-up or shake-off state associated with an antibonding sigma molecular orbital of oxygen. This work also demonstrates that optical luminesence spectra provide state-specific information about the products of core hole excitation and relaxation.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 7777-7777 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 8011-8016 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermal stress effects of the inter-level dielectric (ILD) layer on the ferroelectric performance of integrated Pt/SrBi2Ta2O9(SBT)/Pt capacitors were investigated. Two different thin film materials, pure SiO2 grown at 650 °C and B- and P-doped SiO2 grown at 400 °C by chemical vapor deposition techniques, were tested as an ILD layer. The ILD layer encapsulated the SBT capacitor array. During high temperature thermal cycling (up to 800 °C) after ILD deposition, which is used for both densifying the ILD and curing of the various damage imposed on the SBT capacitors, a large thermal stress occurred in the bottom Pt layer due to the thermal expansion mismatch between the various layers. In particular, the pure SiO2 ILD layer between the capacitors did not allow thermal expansion of the Pt layers, which led to a large accumulation of compressive stress in the layer. This resulted in hillock formation in the bottom Pt layer and eventual capacitor failure. However, the B- and P-doped SiO2 ILD layer contracted during thermal cycling by removing residual impurities, which allowed greater expansion of the Pt layer. Therefore, compressive stress accumulation did not occur and excellent ferroelectric properties were thus obtained from the integrated capacitor array. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 115-119 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The nucleation and growth of Hg1−xCdxTe on CdTe(211)B/Si(211) substrates by molecular beam epitaxy are comprehensively studied by in situ reflection high energy electron diffraction and transmission electron microscopy. Microtwins are observed to be formed at the interface, but are overgrown later as the growth proceeds. It is shown that the three-dimensional growth at the nucleation stage of HgCdTe on CdTe(211)B/Si and CdZnTe(211)B is more likely due to the higher surface energy of Hg1−xCdxTe than that of CdTe(211)B and CdZnTe(211)B. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 3 (1996), S. 688-690 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Envelope instability is investigated in a storage ring using particle simulation. A typical distortion pattern of the instability is observed in transverse phase planes of cold ion beams considering the storage ring both with and without ring periodicity perturbations. The dependence of the blow-up rate of the instability on the single particle phase advance of the storage ring is calculated. Typical e-folding blow-up times of the envelope instability increase from 10−5 s to 10−2 s when the single particle phase advance is smaller than 90°. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 6190-6196 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present an efficient and accurate continuum-mechanics approach for the numerical prediction of displacement, stress, strain, and strain energy density fields in an anisotropic substrate (modeled as a half-space) due to a buried quantum dot (QD). Our approach is based on Green's function solution in anisotropic and linearly elastic half-space combined with the Betti's reciprocal theorem. Numerical examples clearly show that the crystalline anisotropy of the III–V semiconductor group has great influence on the elastic fields, as compared to the isotropic solution. In particular, it is found that the hydrostatic strain and strain energy density on the surface of anisotropic half-space made of different crystalline materials due to a cubic QD can be substantially different, and therefore, the isotropy approximation neglecting their differences should not be used in general. Furthermore, the hydrostatic strains on the surface of an anisotropic half-space due to a finite-size (cubic) QD and an equal-intensity point QD at relatively large depth (about twice the side length of the cubic QD) can still be quite different, in contrast to the corresponding isotropic result. These observations indicate that in modeling and analyzing the mechanical and electronic behaviors of QD semiconductor structures, the effect of crystalline anisotropy should be considered in general. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3356-3356 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A high precision mirror for measuring the storage ring beam size is under fabrication for the APS diagnostics beamline. The mirror, which will be located at 12.9 meters from the bending magnet source, is required to maintain less than 1.6 microradian slope error. The mirror design consists of a slot in the center in order to reduce incident power from the 300-mA, 7-GeV beam during normal operation. Water channels with fins are machined in the GlidCop mirror body to protect it against extremely high heat loads under accidental beam deviations. The mechanical design of the mirror, and results from a thermal analysis are presented in this paper. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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