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The effect of air humidity on nutrient uptake of some greenhouse plants (1987)

Gisleröd, H. R. ; Selmer-Olsen, A. R. ; Mortensen, L. M.

Springer

Plant and soil 102 (1987), S. 193-196

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ISSN: 1573-5036

Keywords: greenhouse plants ; nutrient uptake ; relative humidity ; transpiration

Source: Springer Online Journal Archives 1860-2000

Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition

Notes: Abstract Young plants of nine different greenhouse species were grown for 24 to 100 days at 55–60, 70–75, and 90–95% relative air humidity (RH) in growth rooms. They were given a complete nutrient solution twice a week. Transpiration rate decreased significantly by increasing RH from the lowest to the highest level inEuphorbia pulcherrima (60%), Begonia × hiemalis (54%), Saintpaulia ionantha (54%), Nephrolepis exaltata (48%), andLycopersicon esculentum (44%). The content of macro nutrient elements in the plant leaves decreased by increasing RH. This decrease was significant only for K and Ca in Lycopersicon and Kjeldahl-N in Nephrolepis. The content of the macro nutrient elements in the growth medium at the end of the experiment was lowest when the plants had been growing at high RH. The elements mainly affected were N and K.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF02370702

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Progress toward structure determination (1989)

Gjønnes, J. ; Olsen, A. ; Matsuhata, H.

New York, NY : Wiley-Blackwell

Journal of Electron Microscopy Technique 13 (1989), S. 98-110

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ISSN: 0741-0581

Keywords: Electron diffraction ; Crystal structure determination ; Structure factor ; CBED ; Life and Medical Sciences ; Cell & Developmental Biology

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Natural Sciences in General

Notes: Convergent-beam electron diffraction provides more precise measurements of diffracted intensity than the traditional method of selected-area diffraction. The intensity is recorded at well-defined beam directions for each reflection in the pattern within disks defined by the incident cone of rays. Measurements relating to structure factors or parameters can be arranged in different ways: intensities at the zone axis position; Kossel line profiles or integrated intensities across Kossel lines; conditions for vanishing contrast at a Kossel line (e.g., critical voltage); separation between Kossel line segments at intersections. Examples of application to refinement of structure parameters (zone axis intensities) and structure factor determination (Kossel line methods) are given.The relation of these magnitudes to theory is discussed, especially for the Kossel line methods. These are described in terms of effective Fourier potentials or gaps at the Bloch-wave dispersion surface. Use of the methods for refinement of structure parameters and structure factors is reviewed with special attention to recent developments. This is seen along two lines: (1) extended scope for the more accurate methods in order to cover larger unit cells and (2) better precision in measurements of intensities.

Additional Material: 11 Ill.