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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Colloid & polymer science 268 (1990), S. 625-629 
    ISSN: 1435-1536
    Keywords: Isotacticpolypropylene cross-linked ; drawing behavior:crystallinity ; structural andtopological features ; yielding,necking phenomena,ultimate properties
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The drawing behavior of cross-linked isotactic polypropylene was analysed. The crystallinity and the composition of the crystalline phase are affected by cross-linking. Structural and topological features play a significant role in the drawing behavior. The yielding, the necking phenomenon, and the ultimate properties, i.e., stress and strain at the fracture, can be correlated with the sample structure. The general picture agrees well with Peterlin's model of cold drawing.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Polymer bulletin 26 (1991), S. 445-449 
    ISSN: 1436-2449
    Keywords: Syndiotactic polystyrene ; FTIR ; Wide-angle X-ray ; Scattering ; ordering phenome
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Summary Films of amorphous syndiotactic polystyrene were exposed to dichloromethane vapour at varying activity, up to a=1. Infrared analysis and wide angle X-ray scattering were used to follow the development of ordered structures, induced by the vapour. It has been found that characteristic bands in the infrared spectrum appear after activity a=0.45, whereas X-rays show that the sample is still amorphous. The appearance of the crystalline reflections occurs at higher activities and a continuous improvement up to a=1 in the X-ray pattern is observed.
    Type of Medium: Electronic Resource
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