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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Analog integrated circuits and signal processing 11 (1996), S. 5-19 
    ISSN: 1573-1979
    Keywords: balanced filters ; analogue ; BIST ; fault diagnosis ; ATPG
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The test and diagnosis of fully differential analogue filters are addressed in this paper. Full coverage of hard/soft faults affecting circuit behaviour can be achieved by adjusting the tolerance window of the built-in self-test circuitry and the amplitude and frequency of the input test signal. Under a single fault assumption, the faulty active or passive component is located and the actual defective value of a faulty passive component is determined. A test generation procedure which results in maximum fault coverage and maximal diagnosis of hard/soft faults in the filter is presented. The test and diagnosis approach can be made compatible with IEEE Std 1149.1 for boundary scan testing.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Weinheim [u.a.] : Wiley-Blackwell
    Materials and Corrosion/Werkstoffe und Korrosion 47 (1996), S. 625-630 
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Oxidationsverhalten von β-NiAl, undotiert und dotiert mit Ce, Y und HfDie Hochtemperaturoxidation von β-NiAl, undotiert und dotiert mit Ce, Y und Hf wurde mittels Thermogravimetrie in He mit p(O2) = 5·10-6 bar bei 1000°C und mittels Hochtemperatur-Röntgendiffraktrometrie bei 950 und 1000°C in Luft untersucht. Nachuntersuchungen der Proben erfolgten mit Hilfe optischer Mikroskopie sowie Rasterelektronenmikroskopie (REM) mit EDX.Thermogravimetrische Messungen ergaben für β-NiAl+Hf eine niedrigere und für β-NiAl+Y eine ähnliche Massenzunahme wie für undotiertes β-NiAl. Bei β-NiAl+Ce wurde eine deutlich höhere Massenzunahme beobachtet. Die in situ-Versuche zeigten, daß in den ersten Stunden des Oxidationsprozesses das metastabile Θ-Al2O3 gebildet wird, das sich im weiteren Verlauf der Oxidation zu dem stabilen α-Al2O3 umwandelt. Der Zeitraum, in dem Θ-Al2O3 zu beobachten ist, hängt vom Dotierungselement und von der Temperatur ab. Die mikroskopische Untersuchung zeigte, daß die ternären Phasen an den Korngrenzen oxidieren, die ternären Phasen innerhalb der Körner aber keine Oxidation aufweisen. Die Korngrenzenoxidation nimmt in der Reihenfolge β-NiAl+Hf, β-NiAl+Y und β-NiAl+Ce zu.
    Notes: The high temperature oxidation of β-NiAl, undoped and doped with Ce, Y and Hf was studied in situ by thermogravimetry in He with p(O2) = 5·10-6 bar at 1000°C and by high temperature X-ray diffraction at 950 and 1000°C in air. After the in situ experiments the samples were analysed by optical microscopy and SEM with EDX.It was observed by thermogravimetry that the weight gain for β-NiAl+Hf is lower than for undoped β-NiAl, whereas the weight gain for β-NiAl+Y was similar to that for β-NiAl. For β-NiAl+Ce an enhanced increase of mass gain was observed. The in situ X-ray-experiments show that in the first hours of the oxidation process the metastable Θ-Al2O3 is formed, which transforms to the protective α-Al2O3 after different periods of time, depending on the dopant element and the temperature. The analysis of the samples shows that the ternary phases along the grain boundaries were oxidized, whereas the ternary phase precipitates within the grains remained unoxidized. The extend of the grain boundary oxidation increases from β-NiAl+Hf and β-NiAl+Y to β-NiAl+Ce.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
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