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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Ultramicroscopy 17 (1985), S. 67-72 
    ISSN: 0304-3991
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Microelectronic Engineering 11 (1990), S. 359-362 
    ISSN: 0167-9317
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Nuclear Instruments and Methods in Physics Research Section A: 298 (1990), S. 189-198 
    ISSN: 0168-9002
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Microelectronic Engineering 9 (1989), S. 433-435 
    ISSN: 0167-9317
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 47 (1997), S. 139-203 
    ISSN: 1573-4889
    Keywords: oxidation ; MoSi2 ; TiSi2 ; air ; oxygen ; O and Si transport in SiO2
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The oxidation behavior of two MoSi2 variants, one Mo-rich and one Si-rich, and TiSi2 was investigated between 1000 and 1400°C in air, oxygen and an 80/20-Ar/O2 mixture. A protective SiO2 scale develops on MoSi2 in all atmospheres in the temperature range investigated. The SiO2 modification changes around 1300°C from tridymite to cristobalite. This change in SiO2 modification seems to cause an enhanced formation of SiO2 and evaporation of MoO3. The SiO2 grows at the MoSi2-scale interface. In air a two-layer scale grows on TiSi2 between about 1000 and 1200°C with an inner inwards growing fine-grain mixture of SiO2 + TiO2 and an outer outward-growing TiO2 partial layer. TiN formation in the transient oxidation is responsible for the formation of the inner mixed partial layer because in N -free atmospheres a scale of a SiO2 matrix with some Ti oxide precipitates inside is formed. A one-layer scale structure similar as that in N-free atmosphere is found on TiSi2 in air at T 〉 1200°C. In oxygen the TiO2 precipitates grow as needles mostly oriented perpendicular to the surface. Due to the faster oxygen transport in TiO2 compared with SiO2, these TiO2 needles act as “oxygen pipes,” causing an enhanced oxidation of TiSi2 in front of these needles. The SiO2 scale dissolves about 1–2% TiO2. This doping causes a mixed oxygenand Si transport with the consequence that the SiO2 scale on TiSi2 grows partly by oxygen transport inwards and Si transport outwards. The SiO2 modification is cristobalite over the entire temperature range investigated.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 48 (1997), S. 171-184 
    ISSN: 1573-4889
    Keywords: TiAl, corrosion ; high-temperature ; kinetics ; nitrogen dependence
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The oxide scale formation on γ-TiAl at 800 and 900°C was studied using high temperature X-ray diffraction as anin situ-method. The experiments were performed in air and in He with 20 vol.% O2. The formation of alumina in the form of α-Al2O3 and of TiO2 in the form of rutile was observed in both atmospheres and the formation of TiN was detected in air. Depending on the atmosphere the diffraction peaks of two different additional phases were detected, which do not exist in any data base nor in the Ti-Al-O phase diagram. One of them, the Z-phase, appears in He with 20 vol.% O2 and the other, the X-phase, in air. The Zphase was also found at room temperature after oxidation at 900°C in air. The growth of both phases, X and Z, starts immediately with the oxidation process and follows the parabolic rate law.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Cellular and molecular life sciences 38 (1982), S. 856-857 
    ISSN: 1420-9071
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Notes: Summary With FESEM the X-ray microanalysis of unstained ultrathin sections (600 Å) free of osmium is possible. Deposits in smooth muscle cells of arteriosclerotic aortae show high calcium-peaks already after 80 sec of measurement. No contamination spots were seen after 11 min of measurement on the same point.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Czechoslovak journal of physics 44 (1994), S. 269-276 
    ISSN: 1572-9486
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract High resolution can be obtained in the scanning electron microscope (SEM) for a very low landing energy of electrons, even for that below 50 eV, when a cathode lens is used with the specimen as a cathode held at a high negative potential but the detection of signal electrons is totally different compared with classical SEM. Primary electrons with an energy of the order of tens of keV are decelerated in the field of the cathode lens to a very low landing energy and signal electrons originating in the specimen are accelerated and collimated by the same field to a narrow beam with an electron energy nearly the same as that of the primary beam. To detect these signal electrons we must deflect them from the optical axis without deteriorating the properties of the primary beam. The design of a novel type of separator of the primary and signal electrons consisting of two stages, each of them formed by the electric and magnetic crossed fields, is presented, together with calculated trajectories for both primary and signal electrons.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of thermal analysis and calorimetry 49 (1997), S. 1025-1037 
    ISSN: 1572-8943
    Keywords: crystallographic evaluation ; evaluation with difference procedure ; kinetics ; Rietveld refinement ; X-ray diffraction ; temperature resolved
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Time and temperature resolved X-ray diffraction was used for thermal analysis. Series of diffraction patterns were measured, while the samples are heated/cooled stepwise or isothermally with freely selectable temperature programs. The method was applied for the investigation of the phase transitions of ammonium nitrate and HMX (1,3,5,7-tetranitro-1,3,5,7-tetraaza-cyclooctane), when the identification of phases was required. Its capability in the field of kinetics is demonstrated with the isothermal investigation of the solid state reaction of ammonium nitrate with copper oxide and the non-isothermal investigation of the high temperature corrosion of nickel, which was performed by means of a difference procedure. For obtaining structural details peak fitting and Rietveld refinement were applied for the investigation of ammonium nitrate and HMX.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of thermal analysis and calorimetry 38 (1992), S. 649-655 
    ISSN: 1572-8943
    Keywords: corrosion ; high temperature oxidation ; non-isothermal kinetics ; X-ray diffraction method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Unter Anwendung eines Diffraktometers mit einer Hochtemperatureinheit wurde unterhalb 570°C mittels Röntgendiffraktion die Oxidation von Fe-ARMCO untersucht. Die Oxidationsprodukte wurden in situ bestimmt und das Differenzverfahren ergabY(T)-Kurven, die die globalen Änderungen zeigen. Diese Kurven wurden anhand der mikroskopisch bestimmten resultierenden Dicken der Oxidschicht kalibriert, wobei man die Funktionx(T) erhält. Dieser Kurve wurde eine berechnete, die Arrheniussche Beziehung enthaltende Funktion angepaßt, wodurch man die Aktivierungsenergie und die Oxidations Geschwindigkeitskonstante als Funktion der Temperatur erhält.
    Notes: Abstract Temperature resolved X-ray diffraction using a diffractometer equipped with a high temperature device was applied to the study of the oxidation of Fe-ARMCO below 570°C. The oxidation products are identified in situ and the difference method yields curvesY(T) showing the global changes. These curves were calibrated to the microscopically measured end thickness of the oxide layer obtaining the growthx(T). A calculated curve including the Arrhenius relation was fitted to thex(T) curve yielding activation energy and values of the oxidation rate constant as a function of temperature.
    Type of Medium: Electronic Resource
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