Electronic Resource
Amsterdam
:
Elsevier
Microelectronic Engineering
7 (1987), S. 21-39
ISSN:
0167-9317
Keywords:
Electron beam testing
;
high-frequency electron probe
;
microwave device testing
;
picosecond time resolution
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0167-9317(87)90004-9
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