ISSN:
1572-9605
Keywords:
YBCO
;
electrical noise
;
substiates
;
normal state
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract We present our studies of the low-frequency excess electrical noise in YBa2Cu3O7-δ thin films in the normal state. We have studied films with varying microstructure deposited on different substrates. The frequency dependence and bias current dependence of the noise power spectral density agree with the behavior expected for noise due to conductance fluctuations. Comparison between films on different substrates shows that the presence of defects such as grain boundaries in the film correlate with significantly enhanced noise levels. The noise levels in our good-quality epitaxial films are several orders of magnitude lower than the anomalously large noise magnitudes reported for YBa2Cu3O7-δ in most of the earlier studies.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00727553
Permalink
