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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Agroforestry systems 24 (1993), S. 21-37 
    ISSN: 1572-9680
    Keywords: paradigm ; agroforestry ; science ; epistemology ; economics
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Abstract Because people need improved agroforestry and because there are perceived limitations in a largely ‘scientific approach’ to agroforestry research and development in the past, an alternative paradigm to gaining knowledge for use in this area is suggested. It is an encompassing approach to gaining knowledge which we call the rationally robust paradigm, RRP. The paradigm has 11 components: 1. Concentrating on site-specific knowledge, often in a geographic information system; 2. being aware of the limited funds to achieve agroforestry objectives; 3. de-emphasizing induction and deduction, and their replacement by or addition of other epistemological bases; 4. accepting lower confidence levels for conclusions and subsequent action; 5. using estimates of median values; 6. using knowledge of the range limits of agroforestry phenomena and factors; 7. giving attention to the system's phenomenon of equifinality and its consequences; 8. de-emphasizing ‘time’ as a factor in system analysis, and replacing it with other system phenomena; 9. using statistical regression techniques but simultaneously seeking to identify and use independent factors (e.g., solar radiation) that function significantly in many models; 10. appropriately using regression techniques emphasizing the use of hypothesized, often-non-linear relationships; and 11. operating in a conceptual clinical milieu. The paradigm is proposed for use throughout agroforestry.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-9605
    Keywords: Submillimeter wave ; laser ; reflection ; surface resistance
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Submillimeter wave laser reflection measurements of surface resistance can provide improved capability in the combination of sensitivity, spatial resolution, and frequency range. We have made reflectivity measurements on metals at 1630 GHz with an uncertainty of less than 0.3%. This sensitivity corresponds to a measurement sensitivity for surface resistance of 0.3 Ω. Assuming anf 2 frequency scaling of high-temperature superconductor surface resistance from the microwave to the terahertz frequency range, this sensitivity corresponds to about 1 ×10−5 Ω at 10 GHz. Capability for 10−7 Ω sensitivity could eventually be possible. Preliminary submillimeter wave reflection measurements of a YBCO thin film have been made with a sensitivity of 1%. Submillimeter wave reflectometry can make it possible to determine the spatial dependence of surface resistance in a wide range of material sizes and shapes. The spatial resolution could be on the order of 0.3–0.5 mm.
    Type of Medium: Electronic Resource
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