ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A method to determine the electrical conductance of thin films such as a-Si:H that does not require contacting electrodes is presented. This method, introduced by Sommer and Tanner, is based on measuring the phase shift of a capacitive transmission line. The lower detection limit for the geometry used here is 10−11 Ω−1, which makes it suitable to determine the photoconductivity of a-Si:H thin films. The method shows reasonable agreement with classical conductance measurements using sputtered electrodes. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147125
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