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  • 1
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report results of high-resolution structure imaging, image processing, and simulation of the c=30.5 A(ring) (Tc =80 K) and c=38.2 A(ring) (Tc =115 K) superconducting polytypoids in the Bi-Ca-Sr-Cu-O system. The increase in c parameter is due to the insertion of two layers of Cu-O perovskite+Ca atoms in each unit cell. From the processed image and simulations, it appears that the central Cu layer in the c=38.2 A(ring) polytypoid may be oxygen deficient. In addition, the image simulation experiments suggest that the oxygen atoms in the Bi-O layers are located at the face center of the Bi lattice.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2394-2396 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Planar defects observed in GaN films grown on (0001) sapphire have been identified as inversion domain boundaries (IDBs) by a combination of high resolution transmission electron microscopy, multiple dark field imaging, and convergent beam electron diffraction techniques. Films grown by molecular beam epitaxy (MBE), metalorganic vapor deposition (MOCVD), and hydride vapor phase epitaxy (HVPE) were investigated and all were found to contain IDBs. The IDBs in the MBE and HVPE films extended from the interface to the film surface and formed columnar domains that ranged in width from 3 to 20 nm in the MBE films and up to 100 nm in the HVPE films. For the films investigated, the MBE films had the highest density, and the MOCVD films had the lowest density of IDBs. The nucleation of inversion domains (IDs) may result from step-related inhomogeneities of the GaN/sapphire interface. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 29 (1973), S. 389-401 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The contrast in electron-microscope lattice images of crystals oriented with a zone axis parallel to the incident electron beam has been computed for several complex oxides with large unit cells. The effects of changes in crystal thickness, image defocus, objective aperture size (up to 100 contributing diffracted beams) and spherical aberration are considered, and it is shown that, under certain conditions, the appearance of the image resembles that of the crystal structure. The bounds of applicability of the simple charge-density approximation are investigated.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 302-302 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Corrections are given to Anstis, Lynch, Moodie & O'Keefe [Acta Cryst. (1973). A29, 138-147].
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 31 (1975), S. 300-307 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The simple infinite-aperture charge-density approximation to lattice imaging is extended to include the effects of finite aperture and objective-lens spherical aberration. Images computed using these approximations are compared with images computed by the accurate N-beam technique and with experiment in order to establish the bounds of applicability of the extended-charge-density approximations.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 39 (1983), S. 197-209 
    ISSN: 1600-5740
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 39 (1983), S. 422-422 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: As a result of a printer's error, Figs. 9(a) and 9(b) in Smith & O'Keefe [Acta Cryst. (1983), A39, 139-148] have been transposed, so that (a) is labelled (b) and (b) is labelled (a).
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 39 (1983), S. 838-847 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Computer-simulated electron-microscope images have been produced for several different aromatic hydrocarbons, as well as the organometallic compound chlorinated copper phthalocyanine. Weak-phase-object images are compared with full multislice imaging calculations that include the resolution-limiting effects of limited spatial and temporal coherence; the comparisons indicate a considerable range of focus and thickness where intuitive image interpretation is possible. This favourable situation arises directly from the low atomic numbers of the atoms comprising the molecules and the almost monotonic fall-off with scattering angle of those structure factors within the resolution limit of the microscope. The occurrence and nature of both first- and second-order resolution-limiting effects on typical 100 and 500 kV images is also discussed.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 46 (1990), S. 948-962 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The crystallographic structure of 3Al2O3-2SiO2 mullite has been studied by means of high-resolution electron microscopy. The best conditions for atomic imaging of this compound are discussed relative to the atomic resolution microscope at Berkeley. [001] multibeam images have been produced at a resolution better than 0.19 nm, allowing the cation sublattice to be directly imaged, with a firm transfer of information on the oxygen sublattice. Under optimal conditions of defocus setting and thickness, typical contrasts have been detected and consistently interpreted in terms of the presence of oxygen vacancies along the defective atomic columns. These observations are discussed in relation to the currently accepted model for the average structure of mullite.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 28 (1972), S. 536-548 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The calculation of amplitudes and phases of beams of electrons diffracted from thin (≤ 100 nm) crystals of W4Nb26O77 is described. These diffraction data are used to compute 11-beam 00l electron microscope lattice images and the effects of instrument aberrations are considered. Several approximations are compared with a more exact 435-beam, two-dimensional computation, and with experimental diffraction data and lattice images. Finally, the projected charge density approximation to image contrast is evaluated.
    Type of Medium: Electronic Resource
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