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  • 1
    Electronic Resource
    Electronic Resource
    Direct imaging of end-of-range compaction in ion beam irradiated silica waveguides by atomic force microscopy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 8429-8432 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The end-of-range compaction induced by megaelectronvolt proton irradiation of fused silica has been imaged by atomic force microscopy. A maximum surface compaction of 50 nm was measured for an ion dose of 4.0×1015ions cm−2. A linear correlation between ion dose and compaction has been observed in the range of 1.0 to 4.0×1016 ions cm−2. When the samples were left at room temperature over a period of several months, the amount of compaction appeared to decrease significantly which suggests some temporal annealing of the waveguides has occurred. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373558
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