ZIB

Hits per page

hit 1 - 1 | 1 hit

Sorting

Electronic Resource

Direct imaging of end-of-range compaction in ion beam irradiated silica waveguides by atomic force microscopy (2000)

von Bibra, M. L. ; Roberts, A.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 87 (2000), S. 8429-8432

add to mindlist on the mindlist

Details

ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The end-of-range compaction induced by megaelectronvolt proton irradiation of fused silica has been imaged by atomic force microscopy. A maximum surface compaction of 50 nm was measured for an ion dose of 4.0×1015ions cm−2. A linear correlation between ion dose and compaction has been observed in the range of 1.0 to 4.0×1016 ions cm−2. When the samples were left at room temperature over a period of several months, the amount of compaction appeared to decrease significantly which suggests some temporal annealing of the waveguides has occurred. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.373558

Permalink

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit