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A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures (1998)

Allers, W. ; Schwarz, A. ; Schwarz, U. D. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 69 (1998), S. 221-225

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We present a new design of a scanning force microscope (SFM) for operation at low temperatures in an ultrahigh vacuum (UHV) system. The SFM features an all-fiber interferometer detection mechanism and can be used for contact as well as for noncontact measurements. Cooling is performed in a UHV compatible liquid helium bath cryostat. The design allows in situ cantilever and sample exchange at room temperature; the subsequent transport of the microscope into the cryostat is done by a specially designed transfer mechanism. Atomic resolution images acquired at various temperatures down to 10 K in contact as well as in noncontact mode are shown to demonstrate the performance of the microscope. © 1998 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1148499

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Scanning and friction-force microscopy of thin C60 films on GeS(001) (1994)

Allers, W. ; Schwarz, U. D. ; Gensterblum, G. ; [et al.]

Springer

Applied physics 59 (1994), S. 11-15

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ISSN: 1432-0630

Keywords: 68.55

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract The surface morphology of thin C60 films grown epitaxially under ultra-high vacuum conditions on layered GeS(001) substrates has been studied by scanning force microscopy. The individual C60 layers were imaged down to molecular resolution. The growth mechanism was found to be of layer-by-layer type at the initial stages of growth, but seems to be very sensitive to the substrate temperature. The tribological properties of these films have been probed simultaneously by means of lateral force microscopy. The frictional coefficient of the C60 layers was determined to be significantly smaller than the frictional coefficient of the GeS substrate. This demonstrates that well-ordered C60 films can have even better lubricating properties than a layered material.