ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The design and construction of a simple new device for nondestructively monitoring the position of an electron beam is described. By modulating a small portion of the electron-beam current, changes in the amounts of charge induced on the monitor electrodes are detected as currents. These currents are related to the location of the "center of charge" of the electron beam. Calculations and experimental results which illustrate the performance of the device are reported. This device is primarily intended for use in electron-beam ion sources and traps, although it could be applied to other situations where the beam current can be modulated. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149754
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