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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 8025-8031 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Compositional inhomogeneities in Co-22 at. % Cr sputtered thin films have been studied quantitatively using atom probe field ion microscopy. For comparison, a Co-22 at. % Cr bulk alloy specimen has also been examined. As predicted from the recently published phase diagram, a solution treated Co-Cr bulk alloy specimen does not contain detectable chemical inhomogeneities. On the other hand, the Co-22 at. % Cr thin film sputter deposited at 200 °C consists of two distinct phases with different Cr concentrations. The size of each phase is in the order of 8 nm which is significantly smaller than the grain size of the specimen; however, the film that was sputter deposited at ambient temperature exhibited a significantly lower level of compositional inhomogeneity. Based on these results, it is concluded that the phase separation progresses when thin films are deposited on heated substrates. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2504-2506 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Co-22 at. % magnetic thin film, sputter deposited on a heated Cu coated Si substrate, was analyzed in the planar direction of the film by atom probe field ion microscopy (APFIM). The atom probe concentration depth profile convincingly showed that the film contained two phases, one enriched in Cr up to 30–35 at. % and the other enriched in Co up to 95–93 at. %. This result indicates that Co-22 at. % Cr thin film deposited on a heated substrate consists of ferromagnetic and paramagnetic phases, each less than a few tens of nanometers in size.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 14 (1995), S. 314-316 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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