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  • 1
    Electronic Resource
    Electronic Resource
    Micro-Raman and infrared reflectivity spectra of YBa2Cu3O7−δ deposited on LaAlO3 and stainless steel/inconel substrates (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1108-1113 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The motivation for this article has been to try to understand the relative phenomenological differences between the behavior of the films of the high-temperature superconductors like YBa2Cu3O7−δ deposited on (a) relatively insulating substrates (like LaAlO3) through sputtering technique and (b) highly metallic substrates (like stainless steel and inconel) through laser ablation method. It is observed that the most prominent Raman bands on LaAlO3 substrate falling near 337, 440, and 503 cm−1 have half widths (defined as the full width at half the maximum intensity) of 22, 42, and 38 cm−1, respectively. The half width gets nearly doubled on the metallic substrates. These results have been attributed to the metal-superconductor interfacial interactions. Further, infrared reflectance measurements and the Kramers–Kronig analysis of the spectra reveal a large difference in the conductivity of the film on LaAlO3 compared to the films on metallic substrates. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360344
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  • 2
    Electronic Resource
    Electronic Resource
    Raman spectroscopy and x-ray diffraction of PbTiO3 thin film (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1920-1925 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A PbTiO3 thin film prepared on silicon substrate by sol-gel technique has been studied by micro-Raman spectroscopy and x-ray diffraction (XRD). The spectra, in comparison to the single crystal work, show high background in the low frequency region and Raman lines are broader, thus revealing the polycrystalline nature of the film. The frequencies of the Raman bands in the film are clearly shifted to lower frequencies compared to the corresponding ones in the single crystal or powder forms. This phenomenon is similar to the hydrostatic pressure effect on the Raman lines of PbTiO3 single crystal. The film, therefore, has grains under stress. This stress is caused by nonequilibrium defects and diffusion at the interface. Measurements at different film positions showed variations in the frequency and width of the Raman bands which are associated with the stress and grain size inhomogeneities. The measured shift in the Raman frequencies suggests grain sizes ≤1 μm. XRD indicates grain size of around 22 nm and an average stress around 1.3 GPa, which was determined using the measured shift for the c-lattice constant. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360229
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  • 3
    Electronic Resource
    Electronic Resource
    Micro-Raman spectroscopy of sol-gel-derived Pb(ZrxTi1 - x)O3 thin films (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Journal of Raman Spectroscopy 24 (1993), S. 459-462 
    Details
    ISSN: 0377-0486
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Thin films of ferroelectric PbZrxTi1 - xO3 were prepared by the sol-gel technique on sapphire and fused-quartz substrates with thicknesses ranging from 0.6 to 1.2 μm. Powders of the above substance were also prepared by hydrolysis and condensation of the same precursor sol and crystallized by holding them at 600°C for either 6 or 12 h. From a comparison of the Raman spectra it is obvious that both powders and the film on sapphire substrate belong to the perovskite structure, whereas the film on fused quartz has a phyrochlore structure. These observations agree well with x-ray measurements of diffraction patterns. Absence of 70 cm-1 E(TO) band in the film suggests that the film is rhombohedral with x being well above 0.535.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jrs.1250240713
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  • 4
    Electronic Resource
    Electronic Resource
    Micro-Raman study of BaTiO3 thin films prepared by the metallo-organic decomposition technique (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Journal of Raman Spectroscopy 25 (1994), S. 215-219 
    Details
    ISSN: 0377-0486
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: A micro-Raman probe was used to characterize thin films of barium titanate synthesized by metallo-organic decomposition and rapid thermal annealing techniques. All films were found to be polycrystalline aggregates with perovskite as the primary phase. The optimum film processing procedure as evidenced by the micro-Raman probe was a combination of rapid thermal annealing at 950°C in an oxygen or argon atmosphere. Fourier transform infrared spectra indicated that samples annealed in a vacuum show higher carbon contamination than those receiving the same heat treatment in an oxygen or argon atmosphere.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jrs.1250250305
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