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  • 1
    Electronic Resource
    Electronic Resource
    Powder diffraction using imaging plates at the Australian National Beamline Facility at the Photon Factory : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1351-1353 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel x-ray diffractometer was installed at the Australian National Beamline Facility at the Photon Factory, Japan, in October 1993. One of the major capabilities of the instrument is high speed high resolution powder diffraction using imaging plate detectors. The diffractometer combines a two circle goniometer and a large cassette in which imaging plates can be loaded covering 320° of 2θ. The diffractometer is enclosed in a large vacuum chamber and can be operated in air, vacuum, or helium. Recently, powder data has been obtained from rutile (TiO2) and NBS Si 640b at wavelengths from 0.62 to 1.9 A(ring) using imaging plates, and has been used to characterize the performance of the instrument. The data has been refined using the Rietveld method and R values of under 2% obtained. The resolution of the system varies from a minimum of about 0.04° to around 0.25° at 2θ angles around 160°, which is the equal of most synchrotron based powder diffractometers, and only slightly worse than that obtained using an analyzer crystal and scintillation detector. Using the imaging plates, 160° of data is simultaneously acquired in an exposure of about 10 min, compared to conventional counter diffractometer scans which routinely exceed 10 hours. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145972
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  • 2
    Electronic Resource
    Electronic Resource
    Direct current servo motor controlled four-jaw slits for synchrotron radiation : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1684-1686 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A four-jaw slit assembly and eight-axis dc servo motor controller have been constructed and are in use at the Australian National Beamline Facility (ANBF) at the Photon Factory. Because of the vacuum operation of the beamline diffractometer, dc servo motors were preferred to stepper motors. Due to the large number of motors to be controlled, commercial dc servo controllers were unsuitable, and an eight-axis controller was designed to be used in conjunction with the E500 CAMAC stepper motor controller. The system has been in use at the ANBF for about one year, and has allowed the integration of approximately 30 dc servo and stepper motors into a standard control system. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145881
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  • 3
    Electronic Resource
    Electronic Resource
    The Australian National Beamline Facility at the Photon Factory (abstract) : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1687-1687 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The Australian National Beamline Facility has been installed at the Photon Factory, Tsukuba, Japan. The construction and operation of the facility has been funded by a consortium of Australian research organizations, universities, and government funding agencies, with the aim of providing Australian scientists with routine access to synchrotron radiation in the hard-x-ray region. The first experiments were performed at the ANBF in November 1992. The facility consists of a general purpose x-ray-beamline, including a simple two-crystal monochromator, delivering either monochromatic x rays (range 5–20 keV) or white radiation to the experimental hutch. The main experimental instrument, a multiconfiguration diffractometer, has recently been installed at the beamline. This unique instrument combines vacuum operation and imaging plate detectors, and can be configured for high-resolution powder diffraction (including a time resolved mode), protein crystallography, and triple-axis experiments. In addition, the white or monochromatic beam can pass through the diffractometer to a secondary experimental table, where experiments such as EXAFS, Laue diffraction, topography, and microbeam measurements are performed. Details of the beamline, monochromator, and diffractometer optics and performance will be described, and an overview will be given of the experimental capabilities of the facility. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145882
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  • 4
    Electronic Resource
    Electronic Resource
    High-resolution triple-crystal x-ray-diffraction experiments performed at the Australian National Beamline Facility in Japan (abstract) : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1483-1483 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The x-ray-diffraction results reported here are from the first high-resolution triple-crystal experiments to be performed at the Australian National Beamline Facility at the Photon Factory. The heart of the facility is a multipurpose two-axis high-resolution vacuum diffractometer (BIGDIFF) Z. Barnea et al., Rev. Sci. Instrum. 63, 1069 (1992) capable of use for high-resolution powder diffraction (using both conventional scintillation detectors and imaging plates), protein crystallography, reflectometry, as well as single-crystal diffractometry. The present experiments were conducted on BIGDIFF in triple-crystal diffraction mode with a monolithic channel-cut Si monochromator (supplied by Professor M. Hart), a single-crystal Si sample, and a four-reflection monolithic channel-cut Si analyzer crystal. The Si(111) sample is a part of a wafer which had been implanted with 100 keV B+ ions (doses 1×1015 and 5×1015 cm−2) through a one-dimensional 0.5 μm thick oxide strip pattern with a 5.83 μm period and 4 μm open region. The triple-crystal data were collected in the form of two-dimensional intensity maps in the vicinity of the 111 Bragg peak, varying the sample rotation (ω) and the analyzer/scintillation detector rotation (2θ). The first results were collected in air both with the as-described sample and after the oxide layer had been removed. Certain slice scans (one-dimensional sections of the two-dimensional intensity maps) were also collected with a vacuum of 1 Torr and reveal considerable improvement in signal to background.The data will be compared with a recent similar study A. Yu. Nikulin et al., J. Appl. Cryst. 27, 338 (1994) performed on BL-14B at the Photon Factory. The new data collected in air indicate that lattice distortion may be mapped with a resolution of approximately 160 A(ring), to a depth of approximately 1.0 μm, providing valuable quantitative information on ion diffusion in such implanted materials. The slice scans collected in vacuum indicate that a depth resolution of 50 A(ring) is certainly achievable using BIGDIFF. The data show the excellent potential of BIGDIFF for extremely good signal to noise and very high resolution in such experiments, and the advantages of working entirely in vacuum. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145947
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  • 5
    Electronic Resource
    Electronic Resource
    High-resolution triple-crystal X-ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure (1995)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 28 (1995), S. 57-60 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The synchrotron X-ray results reported here are from the first high-resolution triple-crystal diffraction experiments performed at the Australian National Beamline Facility (ANBF). At the centre of the ANBF is a multipurpose high-resolution two-axis vacuum X-ray diffractometer. The Si(111) sample studied has been implanted with B+ ions through a one-dimensional SiO2 strip pattern with a 5.83 μm period and 4 μm open region, to produce a sample with a periodic superstructure in the lateral direction. The triple-crystal data were collected in the form of two-dimensional intensity maps in the vicinity of the 111 Bragg peak. Results collected in both air and vacuum are compared, as are results with and without the oxide layer. The data collected in vacuum indicate that it is possible at the ANBF to measure lattice distortions perpendicular to the sample surface with a 50 Å depth resolution.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889894010101
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  • 6
    Electronic Resource
    Electronic Resource
    High-Resolution Mapping of Two-Dimensional Lattice Distortions in Ion-Implanted Crystals from X-ray Diffractometry Data (1995)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 28 (1995), S. 803-811 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The triple-crystal synchrotron X-ray diffractometry data described by Nikulin, Stevenson, Hashizume, Wilkins, Cookson, Foran & Garrett [J. Appl. Cryst. (1995), 28, 57–60] has been analyzed to map out two-dimensional (two-dimensional) lattice distortions in silicon (111) crystals implanted with B+ ions of 100 keV energy through a periodic SiO2 strip pattern. The lateral periodic structure produced a series of satellite reflections associated with the 111 Bragg peak. The 2D reconstruction incorporates the use of the Petrashen–Chukhovskii method, which retrieves the phases of the Bragg waves for these satellite reflections, together with that for the fundamental. The finite Fourier series is then synthesized with the relative phases determined. Localized distortions perpendicular to the surface arising from deposited B+ ions in near-surface layers of the crystal are clearly displayed with spatial resolutions of 0.016 and 0.265 μm in the depth and lateral directions, respectively. For a sample with the oxide layer removed from the surface, two equally plausible strain maps have been obtained by assigning relative phases to 11 satellites using a sequential trial method and a minimum-energy method. Failed map reconstructions for the oxide-covered sample are discussed in terms of the non-unique solutions of the Petrashen–Chukhovskii phase-recovery algorithm and the ambiguous phases determined for the satellites.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889895008788
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  • 7
    Electronic Resource
    Electronic Resource
    An eight-position capillary sample spinning stage for the diffractometer at BL20B at the Photon Factory (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 823-825 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An eight-position capillary sample spinning stage has been developed for use in conjunction with the versatile vacuum diffractometer (BIGDIFF) at BL20B at the Photon Factory. BIGDIFF is often used in its powder diffraction mode using powders mounted in capillaries and up to eight imaging plates to record the diffraction pattern from the sample. Using the multiple spinning stage a number of diffraction patterns can be recorded on the imaging plates if the imaging-plate cassette is moved behind the Weissenberg screen to a new position after exposure of the sample to the beam. Not only is this system more efficient in terms of time saved in the pumping-down process, but also it has the advantage of allowing the diffraction patterns of standards to be recorded, thereby calibrating both the angle scale of the diffractometer and the intensity scales of the imaging plates absolutely.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597017780
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  • 8
    Electronic Resource
    Electronic Resource
    The Performance of the Australian Powder Diffractometer at the Photon Factory, Japan (1995)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 28 (1995), S. 513-517 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Australian scientists have built and installed an X-ray powder diffractometer of an unusual design on the Australian beamline at the Photon Factory synchrotron-radiation facility within the National Laboratory for High Energy Physics (KEK), Tsukuba, Japan. The diffractometer is a Debye–Scherrer camera of 0.573 m radius. The place of the cylindrical film in a conventional camera of this type is taken by image plates. To minimize scattering and absorption by air, the instrument can be evacuated. The instrument is now in operation and has been tested with a specimen of the rutile phase of TiO2. This material has been thoroughly studied previously and it has been demonstrated that time-of-flight neutron powder diffraction, conventional neutron powder diffraction, single-crystal neutron diffraction and single-crystal X-ray diffraction lead to a consistent set of values for the anisotropic thermal parameters and the one positional parameter. The powder specimen of rutile for use at KEK was diluted with gum tragacanth and inserted into a glass capillary of 0.5 mm diameter. The beam from the synchrotron is incident on a silicon (111) channel-cut monochromator. Data were collected to ±165°2θ at wavelengths of 0.62, 1.10, 1.54 and 1.90 Å. The exposure time for each data set was 10 min. The resolution of the instrument agrees with theoretical prediction and is such that the full width at half-maximum of a reflection varies from 0.04° at 20°2θ to 0.2° at 160°2θ for a wavelength of 1.54 Å. The intensity from a 10 min exposure is more than sufficient for Rietveld refinement (Rexp 〈 1%).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889894014627
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  • 9
    Electronic Resource
    Electronic Resource
    Structure Refinements of the Layered Intergrowth Phases SbIIISbV xA1−xTiO6 (x∼0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data (1997)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 53 (1997), S. 861-869 
    Details
    ISSN: 1600-5740
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The structures of the layered intergrowth phases SbIIISb^{\rm V}_xAl-xTiO6 (x \simeq 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^{\rm III}_3Sb^{\rm V}_xA3−xTiO14 (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^{\rm III}_nSb^{\rm V}_xAn−xTiO4n+2 are part of a structurally homologous series.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108768197007787
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  • 10
    Electronic Resource
    Electronic Resource
    Interaction between spin-labelled penicillins and lanthanide ions
    Amsterdam : Elsevier
    Journal of Inorganic and Nuclear Chemistry 41 (1979), S. 1089-1091 
    Details
    ISSN: 0022-1902
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0022-1902(79)80099-8
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