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  • 1
    Electronic Resource
    Electronic Resource
    The Australian National Beamline Facility at the Photon Factory (abstract) : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1687-1687 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The Australian National Beamline Facility has been installed at the Photon Factory, Tsukuba, Japan. The construction and operation of the facility has been funded by a consortium of Australian research organizations, universities, and government funding agencies, with the aim of providing Australian scientists with routine access to synchrotron radiation in the hard-x-ray region. The first experiments were performed at the ANBF in November 1992. The facility consists of a general purpose x-ray-beamline, including a simple two-crystal monochromator, delivering either monochromatic x rays (range 5–20 keV) or white radiation to the experimental hutch. The main experimental instrument, a multiconfiguration diffractometer, has recently been installed at the beamline. This unique instrument combines vacuum operation and imaging plate detectors, and can be configured for high-resolution powder diffraction (including a time resolved mode), protein crystallography, and triple-axis experiments. In addition, the white or monochromatic beam can pass through the diffractometer to a secondary experimental table, where experiments such as EXAFS, Laue diffraction, topography, and microbeam measurements are performed. Details of the beamline, monochromator, and diffractometer optics and performance will be described, and an overview will be given of the experimental capabilities of the facility. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145882
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  • 2
    Electronic Resource
    Electronic Resource
    The Australian diffractometer at the Photon Factory : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1069-1072 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Outlined are design features of a versatile high-resolution two-axis diffractometer that is being constructed for operation at the Photon Factory as an Australian national facility. The instrument features optional use of multiple-imaging plates on a translating cassette to allow rapid recording of an almost complete range of data covering both the high-angle and small-angle scattering regime or alternatively the use of electronic detectors. The instrument will be capable of operation in various modes including the following: (i) high-resolution powder diffraction with single-channel counter and crystal analyzer, (ii) high-resolution, high-speed powder diffraction in the Debye–Scherrer mode with imaging plates as recording medium, either stationary or translating (for time-dependent studies), (iii) small-angle x-ray scattering with imaging plates as recording medium, (iv) protein crystallography in screenless Weissenberg mode, and (v) two- or three-axis single-crystal diffractometry. The salient features of the instrument are the use of a double-crystal sagittal focusing monochromator as primary monochromator together with the optional use of a condensing–collimating channel-cut (CCCC) monochromator or other channel-cut monochromator as secondary monochromator. The use of a CCCC monochromator enables fine tuning of beam position on sample, harmonic suppression, beam-condensation, and variation of wavelength bandpass. Further features include the use of high-precision incremental encoders on both axes, together with the capability of operating the whole diffractometer, including secondary monochromator and detectors, in vacuum of order 10−3 Torr in order to reduce absorption and parasitic scattering, and the use of a large camera radius (approximately 0.57 m) for the imaging plate cassette in order to increase angular resolution and signal to noise.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143202
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  • 3
    Electronic Resource
    Electronic Resource
    On the design of a high-speed combined high-resolution powder diffractometer and small-angle scattering system with time-resolution capability based on the use of imaging plates and CCCC monochromators : International conference on synchrotron radiation instrumentation (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2537-2540 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Design features of a proposed high-resolution, high-speed powder diffractometer for operation at a synchrotron source are described. A key feature of the design is the use of imaging plates to record an almost complete range of data including both the high-angle and the small-angle scattering regime. The x-ray optics involve the use of a condensing-collimating channel-cut monochromator (CCCC) to achieve narrow parallel beams with cross sections of the order of 50 μm in the plane of diffraction, so that geometrical aberrations are very low and the beam cross section is well matched to the spatial resolution of the imaging plate detector. Angular resolution in 2θ of the diffractometer is easily variable, and designed to range from 0.01° upwards. Optional translation of the detector perpendicular to the incident-beam direction makes it possible to obtain time-resolved data. Applications of the instrument include high-resolution powder data collection for Rietveld analysis, studies of dynamic phenomena such as chemical reactions and phase transformations, particle-size determination, texture analysis, residual-stress measurements, single-crystal studies of the truncation-rod effect and surface scattering, microdiffraction, combined high-angle and small-angle scattering measurements, and studies of multilayer structures. As an illustration of the sort of results attainable with the proposed system, we present an oscillation photograph of the crystal-truncation rod effect for a Si wafer which was recorded at a synchrotron source using an imaging plate as the detector.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141081
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  • 4
    Electronic Resource
    Electronic Resource
    Time-Resolved Grazing-Incidence Diffraction Studies of Thin Films Using an Imaging-Plate Camera and Focusing Monochromator (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 107-111 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597018128
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  • 5
    Electronic Resource
    Electronic Resource
    Synchrotron Radiation Study of the Relation between Structure and Strain in Polyurethane Elastomers (1997)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 4 (1997), S. 163-168 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: This paper describes a system for the study of the relation between structure and applied strain in thermoplastic polyurethane elastomers using the Australian National Beamline Facility at the Photon Factory, KEK, Tsukuba, Japan. The system uses the sagittal focusing monochromator at beamline 20B to provide a high-intensity focused beam which then falls on the specimen mounted in a miniature tensometer mounted in the unique vacuum diffractometer (BIGDIFF). Imaging plates were used to record simultaneously SAXS and WAXS patterns from the specimen at a particular strain. The change in SAXS and WAXS patterns with loading and unloading was recorded using a ten-plate imaging-plate changer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597003245
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  • 6
    Electronic Resource
    Electronic Resource
    Application of Imaging-Grazing-Incidence X-ray Diffraction and Specular Reflectivity to the Structural Investigation of Quantum-Confinement Semiconductor Devices (1997)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 4 (1997), S. 169-174 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: X-ray reflectivity and grazing-incidence X-ray diffraction techniques have been employed to investigate the structure of quantum-well and quantum-dot semiconductor devices. This work has been performed using both laboratory and synchrotron radiation sources. The use of synchrotron radiation enabled reflectivity studies to be performed on small samples, and established the feasibility of imaging-grazing-incidence diffraction studies on quantum-confinement structures. Interdiffusion effects in quantum-well and quantum-dot structures, the disordering of overlayers grown on quantum dots, and the variation in diffraction pattern with incident angle have been observed. It is evident that X-ray reflectivity and imaging-grazing-incidence X-ray diffraction yield quite different but complementary information.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597004123
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  • 7
    Electronic Resource
    Electronic Resource
    Problems associated with the measurement of X-ray attenuation coefficients. II. Carbon. Report on the International Union of Crystallography X-ray Attenuation Project (1990)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 46 (1990), S. 402-408 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Measurements are reported of the mass attenuation coefficient of carbon taken by laboratories participating in the International Union of Crystallography X-ray Attenuation Project. Data resulting from a similar study using silicon were published earlier [Creagh & Hubbell (1987). Acta Cryst. A43, 102-112]. The data are self consistent, for the most part, to 0.5% for the energy range 6 to 60 keV, and accords well with earlier experimental data. These data are about 3% less than the theoretically calculated data [Saloman & Hubbell (1986). X-ray Attenuation Coefficients (Total Cross Sections). Comparison of the Experimental Data Base with the Recommended Values of Henke and the Theoretical Values of Scofield from 0.1 to 100 keV. Report NBSIR 86-3431. US Department of Commerce, NBS, Gaithersburg, MD, USA; Berger & Hubbell (1987). XCOM. Photon Cross Sections on a Personal Computer. Report NBSIR 87-3597. US Department of Commerce, Gaithersburg, MD, USA] over the energy range for which measurements were made. Hence carbon appears to be an example in which the renormalization, always a decrease, of Scofield's photo-effect calculations [Scofield (1973). Report UCRL-51236. Lawrence Livermore Laboratory, Livermore, California, USA], as was implemented by Hubbell [Int. J. Appl. Radiat. Isot. (1982), 33, 1269-1290], would improve agreement with measured data.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767389013887
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  • 8
    Electronic Resource
    Electronic Resource
    Problems associated with the measurement of X-ray attenuation coefficients. I. Silicon. Report of the International Union of Crystallography X-ray Attenuation Project (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 102-112 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: X-ray attenuation coefficient measurements made on single-crystal silicon specimens by participants in the International Union of Crystallography Attenuation Project are presented for the energy range 8-60 ke V. Twelve laboratories using eight different experimental configurations have provided data for analysis. A comparison is made between measurements using the different techniques at those characteristic wavelengths of interest to crystallographers. Comparison of these measurements with available theoretical cross sections suggests that a model in which the thermal diffuse scattering cross section is used instead of the Rayleigh scattering cross section for the calculation of the theoretical total scattering cross section gives better agreement with the experimental values. No basis was found for preferring one of three current theoretical tabulations of photoelectric absorption cross section over the others.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767387099793
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  • 9
    Electronic Resource
    Electronic Resource
    An eight-position capillary sample spinning stage for the diffractometer at BL20B at the Photon Factory (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 823-825 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An eight-position capillary sample spinning stage has been developed for use in conjunction with the versatile vacuum diffractometer (BIGDIFF) at BL20B at the Photon Factory. BIGDIFF is often used in its powder diffraction mode using powders mounted in capillaries and up to eight imaging plates to record the diffraction pattern from the sample. Using the multiple spinning stage a number of diffraction patterns can be recorded on the imaging plates if the imaging-plate cassette is moved behind the Weissenberg screen to a new position after exposure of the sample to the beam. Not only is this system more efficient in terms of time saved in the pumping-down process, but also it has the advantage of allowing the diffraction patterns of standards to be recorded, thereby calibrating both the angle scale of the diffractometer and the intensity scales of the imaging plates absolutely.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597017780
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  • 10
    Electronic Resource
    Electronic Resource
    Tensometry of carbon fibres and elastomers at the diffractometer at BL20B of the Photon Factory (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 958-961 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Two systems have been developed for the simultaneous recording of the SAXS and the WAXS patterns from carbon fibre and elastomer samples which are placed under stress. The systems have been designed to fit inside the versatile vacuum diffractometer (BIGDIFF) at the Photon Factory. In one system, use is made of the ability to move the imaging-plate cassette. In the other, use has been made of an imaging-plate changer which can deliver up to 13 plates into position with a duty cycle of about 60 s. In this case each imaging plate can record SAXS/WAXS patterns in the range 0.5–20° due to the passage of the beam through the specimen which is mounted in a specially designed tensometer. Because BIGDIFF is a vacuum diffractometer and parasitic scattering is small, exposure times as short as 2 s can give acceptable SAXS/WAXS patterns. The systems have been used for the study of both the change of structure with strain, and the relaxation processes which occur as a result of the sample being strained at a fixed rate by a predetermined amount.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597018694
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