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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It has recently been reported that Fe layers can couple through Pd interlayers, with at least one region of weak antiferromagnetic coupling.1 This system, with coupling fields of only a few tens of Gauss, is potentially attractive for low-field device applications. Additionally, compared to the case of multilayer systems based on noble metal spacer layers, the high paramagnetic susceptibility of Pd and its tendency to ferromagnetic order are expected to lead to modified coupling mechanisms. We report on the growth, structural properties, magnetic properties, and magnetotransport properties of epitaxial (100)Fe/Pd superlattices. Samples consisting of 10 bilayers, with Fe layer thicknesses ≈20 A(ring) and Pd layer thicknesses in the range 10–50 A(ring) (including in "wedge'' geometries), have been fabricated by molecular beam epitaxy onto (100)MgO substrates. The structure was characterized by reflection high-energy electron diffraction, x-ray diffraction, atomic force microscopy, and transmission electron microscopy. The structural and magnetic properties of the multilayers are found to be highly dependent on the growth procedures. Optimized growth conditions, including in particular the absence of any buffer layers, result in overall coercive fields below 15 G and allow the detection of small coupling fields. Magnetization measurements unambiguously reveal the presence of a weak uniaxial anisotropy in the Fe layers, resulting in split hysteresis loops along one of the two in-plane 〈100〉Fe directions. These loops are similar to those normally associated with antiferromagnetic (AFM) coupling. No evidence of AFM coupling has been found in the present study. Magnetoresistance measurements show abrupt changes of resistivity of up to 1.5% at low temperatures, which can be well explained by anisotropy effects during rapid reversals of the Fe layers.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 1655-1657 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present tunneling experiments on Fe(001)/MgO(20 Å)/FeCo(001) single-crystal epitaxial junctions of high quality grown by sputtering and laser ablation. Tunnel magnetoresistance measurements give 60% at 30 K, to be compared with 13% obtained recently on (001)-oriented Fe/amorphous-Al2O3/FeCo tunnel junctions. This difference demonstrates that the spin polarization of tunneling electrons is not directly related to the density of states of the free metal surface—Fe(001) in this case—but depends on the actual electronic structure of the entire electrode/barrier system. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3663-3665 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present experiments of magnetization reversal by spin injection performed on pillar-shaped Co/Cu/Co trilayers. The pillars (200×600 nm2) are fabricated by electron beam lithography and reactive ion etching. Our data for the magnetization reversal at a threshold current confirm previous results on similar pillars. In addition, we present another type of experiment that also clearly evidences the control of the magnetic configuration by the current intensity. Our interpretation is based on a version of the Slonczewski model in which the polarization of the current is calculated in the Valet–Fert model of the giant magnetoresistance with current applied perpendicular to plane. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 3774-3774 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have performed direct measurements of the Pd 4d orbital and spin moments in Pd/Fe multilayers with different Pd interlayer thicknesses, using x-ray magnetic circular dichroism (XMCD) at the L2,3 edges of Pd. The Pd/Fe multilayers were grown by molecular beam epitaxy on MgO (001) substrates and the XMCD experiments were performed on beamline 6 at the ESRF using fluorescence yield detection. We found that the Pd atoms directly at the interface are strongly polarized with a total moment of 0.4 μB/atom. The orbital moments are found to be small (0.0–0.04 μB). The hybridization of the Pd 4d states with the Fe 3d band leads to a small increase in the number of Pd 4d electrons, of about 0.1 electron per Pd atom. The thickness dependence of the XMCD shows that the Pd atoms are magnetically polarized up to four layers from the interface. From the spectral features observed after the L3 and L2 white lines we can also show that the structural Pd/Fe interface is smooth and that in the two atomic layers adjacent to Fe, the Pd atoms have a local structure imposed by the epitaxy on Fe which differs from face centered cubic. The relation between electronic structure and magnetic properties will be discussed. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Magnetism and Magnetic Materials 126 (1993), S. 367-373 
    ISSN: 0304-8853
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1432-0630
    Keywords: PACS: 68.35.Fx; 68.55.-a; 81.10.-h
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract. Interlayer diffusion in epitaxial systems with a high energy barrier at the atomic steps – the so-called Ehrlich–Schwoebel (ES) barrier – is strongly reduced. As a consequence of this, a continuous accumulation of roughness takes place during growth. This undesirable effect can be corrected by using surfactant agents. We have studied the influence of the ES barrier on the preparation of epitaxial films on Cu(111), and the surfactant effect of a monolayer of Pb.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1432-0630
    Keywords: 78.70 ; 73.40 ; 75.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The coupling of Cr to Fe in stacked Cr/Fe/Cr trilayers is studied by circular magnetic X-ray dichroism using fluorescence yield to monitor the absorption. From the dichroic spectra, we determine the thickness dependent average magnetic coupling of Cr to Fe for Cr layer thicknesses of 1, 2 and 3 ML. We compare our results to new calculated spectra. Additionally, all Cr spectra show significant contributions due to photon scattering processes at theL 2, 3 absorption edges depending on the degree of circular polarization.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1432-0630
    Keywords: PACS: 78.70; 73.40; 75.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  The coupling of Cr to Fe in stacked Cr/Fe/Cr trilayers is studied by circular magnetic X-ray dichroism using fluorescence yield to monitor the absorption. From the dichroic spectra, we determine the thickness dependent average magnetic coupling of Cr to Fe for Cr layer thicknesses of 1, 2 and 3 ML. We compare our results to new calculated spectra. Additionally, all Cr spectra show significant contributions due to photon scattering processes at the L 2,3 absorption edges, depending on the degree of circular polarization.
    Type of Medium: Electronic Resource
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