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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 7491-7496 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method to calculate the contact stiffness between a layered material and an ultrasonic atomic force microscope (UAFM) tip is proposed. The radiation impedance method is used to determine the ratio of the applied force to the average displacement within the contact area. This information is used in an iterative algorithm based on Hertzian theory to obtain the contact stiffness. The algorithm converges into a couple of iterations and does not suffer from numerical convergence difficulties as does finite element analysis (FEA). In the ultrasonic frequency range, comparisons with Hertzian theory and FEA show the validity of the results in a quasistatic case. Definitions of the minimum detectable layer thickness and the penetration depth of the UAFM are given and evaluated for several thin film–substrate pairs. These results also show the potential of the method for modeling defects and power loss due to radiation in layered materials. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1950-1952 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a technique in which atomic force microscopy at ultrasonic frequencies is used to determine the thickness of thin films. In this technique, the resonance frequency of a flexural mode of an atomic force microscope cantilever is used to determine the tip-sample contact stiffness. This allows the film thickness to be determined, provided that the tip and sample elastic moduli and radii of curvature are known. We report experimental results for thin metal and polymer films deposited on silicon substrates and compare them with the predictions of a theoretical model. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1628-1630 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An actuation method for atomic force microscope (AFM) cantilevers in fluids is reported. The radiation pressure generated by a focused acoustic transducer at radio frequency (rf) (100–300 MHz) exerts a localized force of controlled amplitude at a desired location on the AFM cantilever. This force can be used to measure the spring constant and other dynamic properties of the cantilever. Furthermore, by amplitude modulating the rf signal input to the acoustic transducer, the cantilever is actuated in the dc–MHz frequency range. This provides a broadband actuation and characterization method for AFM cantilevers with arbitrary geometry. The technique is demonstrated on AFM cantilevers with spring constants in the 0.01–10 N/m range using a micromachined acoustic transducer/Fresnel lens structure operating at 179 MHz in water. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Research in nondestructive evaluation 8 (1996), S. 189-197 
    ISSN: 1432-2110
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Ultrasonic Lamb wave techniques are widely used in a number of NDE applications. To excite Lamb waves, mode conversion of bulk waves or photoacoustic excitation often are used. Both of these approaches suffer from the need for liquid couplant or ablation of materials to reach a good signal-to-noise ratio. In this paper, we propose a novel technique that utilizes point source excitation and detection of Lamb waves through dry, elastic contacts to monitor velocity changes. A pair of pin transducers is used to excite and detect theA 0 mode Lamb wave in the pipe wall, and the wave velocity is obtained by time-of-flight measurement. Any change in the pipe wall thickness can be detected by the change in the Lamb wave velocity due to the dispersive nature of theA 0 mode. We demonstrate the power of this approach in ultrasonic pipe erosion/corrosion monitoring and its potential application in aircraft skin defect imaging. We present results of measurements of plate thickness and erosion/corrosion in a section of pipe that was removed from service, as well as imaging of defects in an aluminum thin plate.
    Type of Medium: Electronic Resource
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