ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Amorphous alloys Ge x Se1−x (0 ⩽x⩽0.20) have been studied using X-ray diffraction and DTA for bulk material, and X-ray diffraction and optical or scanning electronic microscopy for thin films deposited on quartz. For x=x e (eutectic composition) ∼ 0.10, crystallization during annealing at T=190° C was never observed in bulk material; it did take place, though slowly, in the films. Annealing of bulk material (x〈0.10) leads to phase separation into trigonal Se and a non-crystalline phase, the observed T g of which increases with the annealing time to a 110° C limit corresponding to the eutectic composition; for x〉0.10 annealing produces a separation between GeSe2 (polymorph II) and a non-crystalline phase again of composition x e, which decomposes afterwards. In the film alloys with x〈0.20, observations under microscope suggests a decomposition of a spinodal type.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00544727
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