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  • 1
    Electronic Resource
    Electronic Resource
    Exchange elasticity in copper(II) dinuclear cryptates (1980)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 102 (1980), S. 5935-5936 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja00538a052
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Comments on the paper by J. Przyluski, J. Plocharski and W. Bujwan (1982)
    Springer
    Journal of thermal analysis and calorimetry 24 (1982), S. 133-133 
    Details
    ISSN: 1572-8943
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01914807
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Etude de verres de se et Se-Te (6% at. Te) Par analyse thermique differentielle (1974)
    Springer
    Journal of thermal analysis and calorimetry 6 (1974), S. 27-36 
    Details
    ISSN: 1572-8943
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Résumé On a étudié par analyse thermique différentielle semi-micro (échantillons de quelques mg) des verres de sélénium et de Se-Te (6 % at. de Te). L'influence des trempes et des recuits à différentes températures, la cristallisation, sont commodément mises en évidence et les tracés s'expliquent bien par les schémas thermodynamiques classiques concernant la vitrification.
    Abstract: Zusammenfassung Selen- und Selen-Tellur- (6% Te) Gläser wurden mittels Halbmikro-Differential-Thermoanalyse (Proben von einigen mg) untersucht. Der Einfluß der Härtung und Wärmebehandlung bei verschiedenen Temperaturen, sowie die Kristallisierung werden erörtert. Die Erscheinungen können unter Anwendung der klassischen Thermodynamik bezüglich der Glasfabrikation gut erklärt werden.
    Notes: Abstract Glasses of Se and Se-Te (6 at. % Te) have been investigated by semi-micro DTA (samples of a few mg). Crystallization, influence of quenching and annealing at various temperatures aroundT g are clearly and conveniently observed on this semi-micro scale.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01911483
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Crystallization of amorphous (bulk and thin films) Gex Se1-x (0〈x〈0.20) alloys (1978)
    Springer
    Journal of materials science 13 (1978), S. 1217-1223 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Amorphous alloys Ge x Se1−x (0 ⩽x⩽0.20) have been studied using X-ray diffraction and DTA for bulk material, and X-ray diffraction and optical or scanning electronic microscopy for thin films deposited on quartz. For x=x e (eutectic composition) ∼ 0.10, crystallization during annealing at T=190° C was never observed in bulk material; it did take place, though slowly, in the films. Annealing of bulk material (x〈0.10) leads to phase separation into trigonal Se and a non-crystalline phase, the observed T g of which increases with the annealing time to a 110° C limit corresponding to the eutectic composition; for x〉0.10 annealing produces a separation between GeSe2 (polymorph II) and a non-crystalline phase again of composition x e, which decomposes afterwards. In the film alloys with x〈0.20, observations under microscope suggests a decomposition of a spinodal type.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00544727
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Elaboration and characterization of amorphous V2O5 thin films-silicon p-n junctions (1989)
    Springer
    Journal of materials science 24 (1989), S. 2493-2496 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Unusual p-n junctions have been obtained by vapour deposition of amorphous V2O5 thin films on monocrystalline p-type silicon wafers and their current-voltage characteristics have been studied. The efficiency of such diodes and the effect of illumination are shown to depend strongly on the parameters of the evaporation process. Results are discussed, with particular emphasis on the role of the electrical charge mobilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01174518
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  • 6
    Electronic Resource
    Electronic Resource
    Electrical and thermal properties of highly quenched amorphous V2O5 thin films (1982)
    Springer
    Journal of materials science 17 (1982), S. 2973-2978 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Amorphous thin films of V2O5 have been prepared by vapour deposition in high vacuum (∼ 10−6 torr). In order to study the role of quenching, various temperatures, ranging from −196 to 260° C, have been selected for the substrate. Differential thermal analysis. X-ray diffraction and conductivity measurements clearly divide the material into two sets, depending on the efficiency of the quenching. Whereas the least-quenched samples resemble those previously obtained by splat-cooling, the better quenched are only barely stable and, as a consequence, exhibit unique features, such as the occurrence of a glassy transition and the highest crystallization temperature ever found for V2O5.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00644678
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  • 7
    Electronic Resource
    Electronic Resource
    Synthesis and EXAFS characterization of amorphous FePS3 thin films (1988)
    Springer
    Journal of materials science 7 (1988), S. 1054-1055 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00720824
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    Paper (German National Licenses)
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