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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 486-487 (June 2005), p. 382-386 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Stabilizing characteristics of heavy metals in the silicate glass (SD) and lead silicate glass(PD) containing Electric Arc Furnace(EAF) dust was studied by the toxic characterization leaching procedure(TCLP) test. Dependence of the amount of EAF dust upon structural changes of SD and PD glasses and TCLP results was also investigated by FT-IR spectroscopy. In the TCLP test,the concentration of heavy metals leached from a glass increased with the amount of EAF dust added. The SD series specimens showed heavy metal leaching lower than the PD series specimens, but the Pb leaching from the PD series specimens was the highest owing to the high Pb content in the PD glass composition. The value R(oxygen/network former ion ratio) was used to compare the leachingcharacteristics of glasses, and the SD had a higer R than PD series specimens to show a better chemical durability. Adding the EAF dust to the SD mother glass decreased the Si-O-Si symmetry and increased the non-bridging oxygen, which weakened the structure and decreased the chemical durability of glasses. It is concluded that SD is more effective in stabilizing the heavy metals of EAFdust than PD series glass
    Type of Medium: Electronic Resource
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