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Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba1−xSrxTiO3 composition spreads (2001)

Chang, K. S. ; Aronova, M. ; Famodu, O. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 79 (2001), S. 4411-4413

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1−xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO3 to SrTiO3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba1−xSrxTiO3 at microwave frequencies. © 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1427438

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