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  • 1
    Digitale Medien
    Digitale Medien
    s.l. : American Chemical Society
    Langmuir 6 (1990), S. 420-424 
    ISSN: 1520-5827
    Quelle: ACS Legacy Archives
    Thema: Chemie und Pharmazie
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    ISSN: 1573-4811
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 6 (1984), S. 184-192 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: Static SIMS spectra from essentially undamaged acrylic polymers have been obtained for total ions doses of 2 × 1012 ions cm-2. For a series of polymethacrylates the spectra can be interpreted in terms of a constant contribution from the polymer backbone plus dominant fragments from the ester side chain. Isomeric butyl methacrylate polymers can be distinguished. Negative ion spectra reflect the O:C atomic ratio of the bulk polymer. Positive ion relative intensities from ethyl methacrylate: hydroxyethyl methacrylate random copolymers correlate with polymer composition. Previous SIMS data from polymethacrylates have been shown to represent highly damaged surfaces.
    Zusätzliches Material: 11 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 4
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 181-185 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The possibility of sub-micron imaging of molecular species on surfaces has been explored using a recently developed time-of-flight (TOF) imaging SIMS instrument which is equipped with a micro-focused (∼500 Å) liquid metal ion source. Two model systems have been studied involving very thin (conducting) layers of organic materials on clean metals: a nonylphenol ethoxylate surfactant on gold and the peptide gly-gly-gly on aluminium.
    Zusätzliches Material: 4 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 5
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 198-213 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The positive and negative ion spectra from homologous series of alkyl methacrylate, hydroxyalkyl methacrylate and alkyl acrylate polymers; poly (methacrylic acid) and poly(methacrylic anhydride) are reported. A systematic interpretation of the spectra can be accomplished on the basis of fragmentation pathways consistent with the known effects of other ionizing radiations. The negative ion spectra, previously little studied, are a powerful probe of structure for this class of polymer.
    Zusätzliches Material: 9 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 6
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 261-274 
    ISSN: 0142-2421
    Schlagwort(e): ToF-SIMS ; PMMA ; molecular weight effect ; relative ion intensities ; Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: This paper is concerned with the effects that polymer molecular weight, casting solvent, sonification (with a non-polymer solvent) and annealing have upon the secondary ion mass spectrometry (SIMS) of polymers.Films of a series of monodispersed poly(methyl methacrylate) (PMMA) standards, Mw 2965-1200000, were prepared by solution casting from four solvents (tetrahydrofuran (THF), 2-butanone, toulene and chloroform) onto clean aluminium (Al) substrates. The PMMA films were characterized by high- and unit-mass resolution time-of-flight secondary ion mass spectrometry (ToF-SIMS). To determine the significance of variations seen in ion intensities, one PMMA sample was re-analysed 24 times, and the scatter in the absolute counts and normalized and ratioed ion intensities for specific (termed ‘key’) positive and negative ions were calculated. This provided 95% confidence error bars, which were subsequently employed. The 95% confidence limits were significantly reduced by normalizing or ratioing.Molecular weight was found to have the greatest effect in the SIMS spectra obtained, with the differences being most marked between Mw=2965 and Mw=89100. This was seen in both the total negative ion counts (m/z 31-200) and the key negative ion ratios. An explanation based on the surface concentration of chain ends is presented. Negative ion ratios were shown to be very sensitive to trace amounts of residual solvents. By annealing above the PMMA glass transition temperature Tg solvent-free films were produced from three solvents and these were spectrally indistinguishable. Solvent-free films could not be produced from THF. Residual solvent was identified by high mass resolution ToF-SIMS. Sonification with hexane, a polymer non-solvent, had a considerable effect on the total negative ion counts (m/z 31-200). No concomitant chemical changes were detected, so this effect is thought to arise from a physical perturbation of the surface. © 1997 by John Wiley & Sons, Ltd.
    Zusätzliches Material: 19 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 7
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 739-746 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The prospects for obtaining highly accurate mass assignments in polymer surface studies using state-of-the-art time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been investigated systematically. For a thick film of poly(ethylene terephthalate) (PET), the reproducibility of mass measurement in both positive ion (range m/z = 0-600) and negative ion (range m/z 0-350) modes has been studied in statistical fashion over a period of several months. Glyceryl monostearate, representing a typical polymer additive, was studied both on PET and as a very thin film on aluminum in order to compare the behavior of insulating and conducting samples. The effect of different mass calibration strategies (including use of atomic and molecular species), mass interferences and metastable peaks on mass accuracy also have been investigated. Finally, the importance of peak intensity for mass resolution and achievable mass accuracy has been determined. The results show that a useful mass accuracy of better than 20 ppm can be achieved over a mass range m/z = 0-600 for these polymer film surface studies under routine operating conditions.
    Zusätzliches Material: 12 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 8
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 62-65 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: A charge compensation system, based on a pulsed lowenergy electron flood source, designed for the 1X23S time-of-flight secondary ion mass spectrometry (TOFSIMS) instrument is described. Its performance in the non-imaging mode is illustrated by spectra from polytetrafluoroethene (PTFE). High-resolution (∼1 pm) imaging of challenging insulating samples under near-static SIMS conditions is demonstrated for the first time.
    Zusätzliches Material: 4 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 9
    Digitale Medien
    Digitale Medien
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 421-429 
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) to the investigation of interface interactions in carbon-fibre composites is discussed. Surface analysis of carbon fibres before and after electrochemical oxidation reveals the dominating effect of molecular contamination of the fibre surface (and hence the importance of processing/handling memory effects) on the spectra obtained. High-resolution SIMS imaging of carbon fibres is particularly useful for contamination identification and clarification of SEM information. Progress in the development of fractography using TOF-SIMS imaging is also discussed; the important experimental parameters are defined whilst illustrating their effect with a real-life example.
    Zusätzliches Material: 7 Ill.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 10
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: A series of fluorine-containing segmented poly(ether urethanes) and poly(ether urethane ureas), previously characterized by angular dependent x-ray photoelectron spectroscopy (XPS) have been re-examined using static secondary ion mass spectrometry (SIMS). Comparison of the data from the two techniques has shown that the intensity of secondary ion signals which characterize the hard and soft segments can be used quantitatively for direct analyis of the molecular composition at the surface. Moreover, the SIMS sampling depth for the conditions used has been shown to be ∼ 10 Å, significantly less than the XPS sampling depth under normal conditions, and similar to the XPS sampling depth at high glancing take-off angle (with respect to the surface normal).
    Zusätzliches Material: 8 Ill.
    Materialart: Digitale Medien
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