Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
64 (1988), S. 4674-4677
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A double-beam interferometer which incorporates quasioptical components developed in this laboratory has been used to measure near millimeter-wave dielectric properties of a variety of ceramic materials. We report here the results obtained on samples of various standard and advanced ceramics including alumina, silicon nitride, beryllia, and boron nitride. Results are compared with the data obtained by other researchers on similar samples.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.341250
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