ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The general theory developed by Michalski [Acta Cryst. (1988), A44, 640-649] has been applied to the cases of hexagonal and rhombohedral structures. The symbols of stacking faults based on Zhdanov's symbols of local structure near the faults have been introduced and assigned to the formal subscripts j, k used in general theory. On this basis the regularities, according to which the faults with different subscripts j, k have the same structures, have been characterized. Then these regularities have been taken into consideration in the derivation of expressions for measurable parameters of changes (caused by faults) in the X-ray intensity distribution. The results obtained for structures 2H, 4H, 6H(33), 8H(44), 10H(55), 12H(66), 3C, 9R(12)3, 12R(13)3 and 15R(23)3 are given. Some results are compared with published data. The physical meaning of the assumption of small values of fault probabilities is discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767388003241
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