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  • 1
    Electronic Resource
    Electronic Resource
    Amperometric determination of glucose, fructose and saccharose at zero applied potential
    Amsterdam : Elsevier
    Talanta 5 (1960), S. 137-140 
    Details
    ISSN: 0039-9140
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0039-9140(60)80164-6
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  • 2
    Electronic Resource
    Electronic Resource
    A new method of highly accurate orientation of single crystals on a standard powder diffractometer (1994)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 27 (1994), S. 703-709 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new method of obtaining high accuracy in a diffractometer refinement of a single-crystal orientation is presented in this paper. The primary errors in goniometer orientations are caused by the fact that, whereas the measurement required is the angle between the atomic plane and the plate face, goniometers in general measure the angle between the atomic plane and a plane defined by the goniometer, which is not necessarily parallel to the plate face. The methods of correcting for these inaccuracies associated with the goniometer orientations that have been used and cited so far are based on the laser-assisted system described by Vig [Proc. 29th Annual Symposium on Frequency Control (1975), pp. 240–247]. The method described in this paper allows one to eliminate these errors by a specially invented method of measurements and calculations without a laser-assisted system or any other additional instruments.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188989400110X
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  • 3
    Electronic Resource
    Electronic Resource
    The diffraction of X-rays by close-packed polytypic crystals containing single stacking faults. II. Theory for hexagonal and rhombohedral structures (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 650-657 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The general theory developed by Michalski [Acta Cryst. (1988), A44, 640-649] has been applied to the cases of hexagonal and rhombohedral structures. The symbols of stacking faults based on Zhdanov's symbols of local structure near the faults have been introduced and assigned to the formal subscripts j, k used in general theory. On this basis the regularities, according to which the faults with different subscripts j, k have the same structures, have been characterized. Then these regularities have been taken into consideration in the derivation of expressions for measurable parameters of changes (caused by faults) in the X-ray intensity distribution. The results obtained for structures 2H, 4H, 6H(33), 8H(44), 10H(55), 12H(66), 3C, 9R(12)3, 12R(13)3 and 15R(23)3 are given. Some results are compared with published data. The physical meaning of the assumption of small values of fault probabilities is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767388003241
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  • 4
    Electronic Resource
    Electronic Resource
    The diffraction of X-rays by close-packed polytypic crystals containing single stacking faults. III. Measurements of diffraction effects caused by stacking faults in plate or film form samples (1995)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 51 (1995), S. 548-558 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A theory that describes the diffraction effects from stacking faults in close-packed polytypic crystal structures was developed in two previous papers of this series [Michalski (1988). Acta Cryst. A44, 640–649; Michalski, Kaczmarek & Demianiuk (1988). Acta Cryst. A44, 650–657]. In this paper, attention is paid to the measurement of these diffraction effects for the cases where needle-shaped or rod-like specimens cannot be made from the given sample (e.g. thin films) or when single-crystal samples should not be destroyed for preparing such specimens. For this purpose, methods of measurement based on standard X-ray diffraction equipment such as oscillation or Weissenberg cameras and a powder diffraction diffractometer have been developed A complete description of the limitation of the area of the reciprocal lattice that can intersect the Ewald sphere has been provided. Examples of the results obtained by these methods are given. The diffractometer two-dimensional scanning method, which allows an undistorted reciprocal lattice to be recorded and higher precision and results more convenient for mathematical treatment than in photographic methods to be obtained, seems to be especially interesting.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767395001681
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  • 5
    Electronic Resource
    Electronic Resource
    The diffraction of X-rays by close-packed polytypic crystals containing single stacking faults. I. General theory (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 640-649 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A general theory of X-ray diffraction by one-dimensionally disordered close-packed polytypic crystals has been developed. A random distribution of all possible single stacking faults for arbitrary n-periodical structure is taken into consideration. Exact expressions for measurable parameters of changes in the intensity distribution caused by faults are given. Initial equations of the theory have been formulated by applying Holloway's [J. Appl. Phys. (1969), 40, 4313-4321] method of analytic solution. For the mathematical description of disorder, successive layers of the perfect structure have been denoted by an additional subscript j. The probability of occurrence of the faulted layer with subscript k after the layer with subscript j has been denoted by αjk. A set of recurrence relations is developed for average phase factors of layers with subscript j on m positions. An arbitrary sequence of layers is written in these relations by using the so-called phase-change factors (after layer with subscript j), determined by Hägg's structure symbols. Terms of the coefficients of the characteristic equation and boundary conditions which are necessary to describe the change in the intensity distribution are given for small values of αjk. Finally, the shifts and broadenings of the reciprocal-lattice points and the changes in the intensity of peak maxima are derived in terms of αjk.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876738800323X
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  • 6
    Electronic Resource
    Electronic Resource
    Leitfähigkeitstitrationen (1936)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 104 (1936), S. 39-40 
    Details
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01385386
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  • 7
    Electronic Resource
    Electronic Resource
    Zur elektrometrischen Bestimmung von QuecksilberI neben QuecksilberII (1941)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 122 (1941), S. 293-293 
    Details
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01358786
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