Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
13 (1980), S. 297-303
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Growth striations in Fe–Si alloy single crystals are studied by X-ray diffraction topography. Variations of interplanar spacing are measured using double-crystal reflection topographs and variations of Si content are calculated taking into account the surface stress relaxations. The results are compared with those obtained by electron-microprobe analysis. The contrast observed in Lang transmission topographs is explained on the basis of the dynamical theory of X-ray diffraction.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889880012095
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |