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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1296-1299 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new and stable scanning tunneling microscope (STM) system has been constructed for the investigation of thin organic films in air. The STM unit is made of Macor, which is machinable ceramic and has a small thermal expansion coefficient and a high mechanical stiffness. Three-dimensional coarse position adjustment (within 3 μm) is carried out using five stacked piezoelectric transducers (PZTs). A cross-type configuration is used to prevent the thermal effect of the x- and y-direction displacement mechanism. In order to achieve high resolution, x-, y-, and z-direction displacements are performed using a tube-type PZT. The z direction of the tube PZT has a high mechanical resonant frequency of 24.4 kHz. Therefore, this STM unit is mechanically rigid, and allows stable operation under mechanical disturbances (sound and mechanical vibration). Moreover, this STM unit can be controlled for 24 h or longer by using an ordinary operational amplifier, because thermal effects are compensated. The STM system can also be used to obtain information on the spatially resolved local tunneling barrier height, which is sensitive to the chemical structure of the sample. The capabilities of this newly designed STM are demonstrated with experiments investigating the morphology and tunneling barrier height of stearic acid thin films on indium-tin-oxide substrates. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 124-125 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new scanning probe microscope based on a scanning tunneling microscope (STM) and a frequency shift of an AT cut quartz resonator has been developed. The quartz resonator coupled to a STM sample is oscillated at its resonance frequency. The shift of the resonance frequency corresponds to the strength of the shearing stress in the sample, and is caused by the shearing force interaction between the STM tip and the sample under the tip scanning. The preliminary images presented show simultaneously STM surface topographies and the changes of subsurface shearing stresses in gold thin films. The sensitivity of our microscope is 0.30 N/m for a 0.2-Hz frequency shift of the quartz crystal resonance frequency.
    Type of Medium: Electronic Resource
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