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  • 1
    Electronic Resource
    Electronic Resource
    Basic investigations for laser microanalysis: I. Optical emission spectrometry of laser-produced sample plumes (1989)
    Springer
    Microchimica acta 98 (1989), S. 185-199 
    Details
    ISSN: 1436-5073
    Keywords: laser microanalysis ; laser ablation ; optical emission spectrometry
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract In order to find optimum conditions for laser ablation and atomization for analytical purposes, time resolved emission spectra of Nd:YAG laser-produced plasma plumes propagating into noble gas atmospheres of different pressures were measured with an optical multichannel analyzer. The time evolution of the plasma temperature was determined. Strong temperature changes were observed depending on the matrix composition. The analytical figures of merit of optical emission spectrometry (OES) of laser-produced sample plasmas were determined using, as examples, measurements of two analytes (silicon and chromium) in homogeneous and low-alloyed standard steel samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01244595
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Potential of a microwave boosted glow discharge source for the analysis of silicon carbide powder (1997)
    Springer
    Fresenius' journal of analytical chemistry 358 (1997), S. 604-609 
    Details
    ISSN: 1432-1130
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract  The microwave boosted glow discharge source has been investigated for its potential to analyse ceramic powders by atomic emission spectrometry. SiC was used as an example. Electrically conducting samples were prepared by mixing the SiC-powder with copper powder and compressing the mixture to pellets. Prior to the measurement the samples were heated to a temperature of 200 °C for 2 h to release molecular species adsorbed on the surface of the powders and to reduce the intensity of molecular bands in the spectrum. The discharge was operated in argon as the plasma gas and boosted with 40 W microwave power. Argon pressure and anode current were optimized to give the best line-to-background ratios. Crater shapes and erosion rates have been measured. The erosion rates were found to be much lower in the pellets (23 nm s-1) than in bulk copper samples (63 nm s-1). Background equivalent concentrations, measured for six elements in the pellets, are in the range of 0.1–6 μg/g.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s002160050477
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Analysis of silicon carbide powder by ETV-ICP-AES (1993)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 346 (1993), S. 1042-1046 
    Details
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary A direct “tandem” atomic spectroscopic method for the determination of Ca, Fe and Ti impurities in SiC powders with various grain size (0.78〈d50〈48.5 μm) has been developed. The method is based on high temperature halogenation of the sample with Freon 12 in a graphite furnace and ICP-AES detection of the evolved sample components. The concentration of the matrix element silicon in the ICP increased to a maximum value after 10s of heating, independent of the grain size of the powder samples. For performing a calibration with standard solutions a finegrained, purified SiC-powder was evaporated simultaneously with the solution residues. The calibration curves produced using this analyte-addition technique and using within-laboratory solid standards were identical within experimental error.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00323713
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    Paper (German National Licenses)
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