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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 1570-1573 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new apparatus using the inductance method has been built to test the homogeneity of large area high-Tc superconducting thin films. The apparatus has an X–Y scanning probe that can be moved at liquid nitrogen temperature to test the different regions of the films. The sample chamber of the apparatus can provide large area with high temperature homogeneity. The maximum sample size that can be measured is 50×50 mm2. A small size of high-Tc superconducting thin film is applied to test the temperature homogeneity of the testing system and the sameness of the gap distance between the surface of the film and probe. A method for testing the apparatus is illustrated, and some experiments for the test of the apparatus have been performed. Experimental results find that the maximum temperature difference is 0.05 K at the surface of the sample mounter, and the drive field remains constant within the error of 5% in the process of X–Y scanning. The apparatus can test the homogeneity of high-Tc superconducting films not only by the superconducting transition temperature Tc, but also by the critical sheet current density Kc. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3752-3753 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanometer-scale recording on an organic-complex thin film with a scanning tunneling microscope (STM) under ambient conditions is demonstrated. The recording marks are made by applying external voltage pulses between the tip and the highly ordered pyrolytic graphite substrate. A 30×30 nm2 STM image with recorded marks is given. The average recorded mark is 1.3 nm in diameter, which corresponds to a data storage density of about 1013 bits/cm2. The current–voltage characteristics measured by the STM show an insulator behavior for the unrecorded regions, and a conductor behavior for the recorded regions, which indicates that the data are recorded by local change of the electrical property of the films. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 3303-3305 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrahigh density data storage from local polymerization on an organic thin film is demonstrated by using a scanning tunneling microscope (STM) operating in air. An organic monomer material, which may become electrical conductive by polymerization, is selected as data storage material. Films prepared by the monomer material are used for data recording. By applying a high electric field with the STM tip to realize local polymerization, highly stable recorded patterns with molecule-sized recorded marks have been performed. One recorded mark corresponds to a polymeric molecule in the film. The marks are 0.8 nm in size. The nearest distance between two recorded marks is 1.2 nm. Having been read 2000 times the recorded patterns show no discernible change. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 850-852 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrahigh density data storage on a novel organic thin film by scanning tunneling microscope (STM) under ambient conditions is demonstrated. The material, N-(3-nitrobenzylidene)p-phenylenediamine (NBPDA), is used for preparing thin film by vacuum evaporation method. Crystalline NBPDA films with electrical bistability are obtained by this method. Recording experiment on the films is made by applying voltage pulses between the STM tip and substrate. The recorded marks are 0.7 nm in size, corresponding to a storage density of 1014 bit/cm2. Current–voltage characteristic measurement shows that the resistance of the unrecorded region of the NBPDA films is much higher than that of the recorded region. The mechanism of recording is discussed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 2997-2999 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrical bistability is a phenomenon in which a device exhibits two states of different conductivities, at the same applied voltage. We report an organic electrical bistable device (OBD) comprising of a thin metal layer embedded within the organic material, as the active medium [L. P. Ma, J. Liu, and Y. Yang, US Patent Pending, (2001)]. The performance of this device makes it attractive for memory-cell type of applications. The two states of the OBD differ in their conductivity by several orders in magnitude and show remarkable stability, i.e., once the device reaches either state, it tends to remain in that state for a prolonged period of time. More importantly, the high and low conductivity states of an OBD can be precisely controlled by the application of a positive voltage pulse (to write) or a negative voltage pulse (to erase), respectively. One million writing-erasing cycles for the OBD have been tested in ambient conditions without significant device degradation. These discoveries pave the way for newer applications, such as low-cost, large-area, flexible, high-density, electrically addressable data storage devices. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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