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  • 1
    Electronic Resource
    Electronic Resource
    Application of disjoining and capillary pressure to liquid lubricant films in magnetic recording (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 3084-3090 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The behavior of liquid lubricant films on the disk surfaces in magnetic recording is analyzed using the concepts of disjoining and capillary pressure. Particular examples analyzed include lubricant distributions on rough and porous disk surfaces, lubricant flow, and the meniscus force acting on the recording slider sitting on the disk surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351467
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  • 2
    Electronic Resource
    Electronic Resource
    Molecular conformation and disjoining pressure of polymeric liquid films (1991)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 94 (1991), S. 8420-8427 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Atomic force microscopy, angle resolved x-ray photoelectron spectroscopy, and ellipsometry are applied to study the conformation of fluorocarbon polymers in molecularly thin liquid films, 5–130 A(ring) thick, on solid surfaces. The combination of these techniques shows that the physisorbed polymers at the solid surface have an extended, flat conformation. In addition, the disjoining pressure of these liquid films is determined from atomic force microscopy measurements of the distance needed to break the liquid meniscus that forms between solid surface and force microscope tip. For a monolayer thickness of ∼7 A(ring), the disjoining pressure is ∼5 MPa, indicating strong attractive interaction between the polymer molecules and the solid surface. The disjoining pressure decreases with increasing film thickness in a manner consistent with a strong attractive van der Waals interaction between the liquid molecules and the solid surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.460075
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  • 3
    Electronic Resource
    Electronic Resource
    Atomic force microscopy of polymeric liquid films (1989)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 7550-7555 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We demonstrate the use of the atomic force microscope (AFM) for studying perfluoropolyether polymer liquid films as thin as ∼20 A(ring). With the AFM we are able to measure three distinct properties of the liquid film: (1) its thickness when the thickness of liquid on the AFM tip is taken into account, (2) the meniscus force acting on the AFM tip as a function of depth into the liquid film, and (3) the topography of the liquid/air interface. All three of these measurements can be done with a very high lateral resolution, ∼1000 A(ring), demonstrating the unique capability of AFM for studying liquid films. With AFM we have observed several interesting properties of these polymeric liquid films. First films thinner than ∼300 A(ring) are fairly uniformly distributed, while films thicker than ∼300 A(ring) slowly dewet the surface. Second, by measuring the meniscus radius of liquid in a micron sized hole on the surface, we can determine the disjoining pressure in a thin liquid film.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.456188
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  • 4
    Electronic Resource
    Electronic Resource
    Roughness of molecularly thin perfluoropolyether polymer films (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 3296-3298 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray reflectivity has been used to measure the roughness of perfluoropolyether (PFPE) polymer films on silicon substrates and carbon overcoats. For PFPE on smooth silicon, we find that the rms roughness of the PFPE–air interface increases slowly from about 2 to 4 Å as PFPE thickness increases from 5 to 33 Å. This increase is consistent with capillary waves roughening the polymer film, but inconsistent with current theories for the dewetting of polymer films. For PFPE on the rougher surface of amorphous hydrogenated carbon, we find that the PFPE polymer smoothes the surface with the rms roughness decreasing from 9 to 4 Å. We also discuss the implications of these results on the limits of disk drive technology. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1326484
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  • 5
    Electronic Resource
    Electronic Resource
    Force microscopy with a bidirectional capacitance sensor (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2296-2308 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new method for sensing cantilever deflection in the atomic force microscope (AFM), based on capacitance measurement, is described. Parameters governing the design of such an instrument are considered in detail. Two different geometries are compared, wire on plate and an integrated flat plate sensor. The electronic circuitry, providing 6×10−19 F noise in a 0.01–1000 Hz bandwidth, is also described. Implementation of the design ideas into a working AFM in ultrahigh vacuum is demonstrated. This AFM allows simultaneous measurement of cantilever deflection in two orthogonal directions, necessary for our nanotribology studies. The theoretical sensitivity of 5×10−7 F/m is not achieved due to roughness. The bidirectional sensing and imaging capabilities are demonstrated for an Ir tip on cleaved graphite, and a diamond tip on diamond films. The capacitance detection technique is compared and contrasted with other AFM sensors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141354
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  • 6
    Electronic Resource
    Electronic Resource
    Molecular layering during evaporation of ultrathin liquid films (1993)
    [s.l.] : Nature Publishing Group
    Nature 363 (1993), S. 527-529 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Tetrakis(2-ethylhexoxy)silane (TEHOS) has chemical struc-ture [(C4H9)-(C2H5)CH-CH2-O]4Si, relative molecular mass MR = 545, refractive index n = 1.439, and density p = 0.880 g cm 3. The volume occupied by one molecule is 1,030 A3; therefore, the thickness of a molecular layer should be ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/363527a0
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  • 7
    Electronic Resource
    Electronic Resource
    Preface (1995)
    Springer
    Tribology letters 1 (1995), S. i 
    Details
    ISSN: 1573-2711
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00209765
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  • 8
    Electronic Resource
    Electronic Resource
    Adhesion and friction properties of hydrogenated amorphous carbon films measured by atomic force microscopy (1995)
    Springer
    Tribology letters 1 (1995), S. 233-246 
    Details
    ISSN: 1573-2711
    Keywords: atomic force microscopy ; adhesion ; friction ; amorphous carbon films ; hydrogen effect
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Atomic force microscopy has been used to measure adhesion and friction forces at the interface between an oxidized metal probe tip and amorphous carbon films of varying hydrogen contents (12.3–39.0 atomic percent hydrogen). The interface of an oxide surface and a hard carbon coating models the unlubricated head-disk interface of current hard disk products. Adhesion forces normalized by the radius of curvature of the contacting tip range from 1.09 to 8.53 N/m. Coefficients of friction values, measured as the slope of the friction versus load plot, range from 0.33 to 0.87. A trend of increasing adhesion forces and coefficients of friction is observed for increasing hydrogen content in the films. We attribute the increase in adhesion and friction to increases in the surface free energy of the carbon films with the incorporation of hydrogen.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00209778
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  • 9
    Electronic Resource
    Electronic Resource
    The interaction of short-chain model lubricants with the surfaces of hydrogenated amorphous carbon films (1995)
    Springer
    Tribology letters 1 (1995), S. 47-58 
    Details
    ISSN: 1573-2711
    Keywords: amorphous carbon ; model lubricants ; temperature programmed desorption
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The adsorption of water and small model perfluorinated lubricants on hydrogenated amorphous carbon (a∶C-H) films of varying hydrogen content was investigated using thermal desorption spectroscopy (TDS). Hydrogen content of the carbon films was measured by Rutherford back scattering (RBS) and elastic recoil spectroscopy (ERS) and correlated to changes in surface free energies measured by contact angle analysis. Hydrogenated carbon films exhibiting the highest surface free energy provided a greater attractive interaction for the model lubricants. All model lubricant species studied - water (D2O), perfluorodiethyl ether (CF3CF2OCF2CF3), perfluoropentane (CF3(CF2)3CF3), perfluorooctane (CF3(CF2)6CF3), 2,2,2-trifluoroethanol (CF3CH2OH), and 1,1,7-H-perfluoroheptanol (CF2H(CF2)5CH2OH)—reversibly adsorbed to the carbon surface with little chemical reaction. Increases in desorption energies with increasing chain length were observed among the adsorbates and are ascribed to increasing van der Waals interactions. Incorporation of alcoholic end groups provided an avenue of hydrogen bonding to the surface and produced an ~20 kJ/mol increase in desorption energy relative to a perfluorinated alkane of the same chain length. Ether linkages within the model lubricant provide little increase in desorption energy as fluorine substituents effectively screen the oxygen. Together these findings implicate a predominantly physisorbed state for perfluorinated lubricants on hydrogenated carbon surfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00157975
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