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  • 1
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Langmuir 10 (1994), S. 592-596 
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 92 (1990), S. 3189-3196 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Migration of very thin (〈30 nm) polymeric films on solid surfaces was investigated quantitatively using two techniques—scanning microellipsometry and scanning small spot x-ray photoemission spectroscopy. The surface diffusion coefficient Ds increases as the film thickness decreases down to 1 nm, however, below 1 nm, Ds becomes independent of polymer film thickness. The functional dependence of Ds with molecular weight M is described, over the limited range of M in the unentangled regime, by M−1.7 The activation energy for polymer segment hopping is about 41 kJ/mol, which is similar to values obtained from bulk self-diffusion of other polymers.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 5861-5868 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Infrared spectra of thin films of polyperfluoroethers on metal and silicon dioxide surfaces were obtained for films with thicknesses between 1 and 1000 nm by p-polarized reflection and modulated polarization techniques. Changes in frequencies and relative intensities of vibrational peaks with film thickness suggest that the conformation of liquid polymers on surfaces is unlike bulk conformation, with polymer chains extended preferentially along the surface.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 94 (1991), S. 8420-8427 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Atomic force microscopy, angle resolved x-ray photoelectron spectroscopy, and ellipsometry are applied to study the conformation of fluorocarbon polymers in molecularly thin liquid films, 5–130 A(ring) thick, on solid surfaces. The combination of these techniques shows that the physisorbed polymers at the solid surface have an extended, flat conformation. In addition, the disjoining pressure of these liquid films is determined from atomic force microscopy measurements of the distance needed to break the liquid meniscus that forms between solid surface and force microscope tip. For a monolayer thickness of ∼7 A(ring), the disjoining pressure is ∼5 MPa, indicating strong attractive interaction between the polymer molecules and the solid surface. The disjoining pressure decreases with increasing film thickness in a manner consistent with a strong attractive van der Waals interaction between the liquid molecules and the solid surface.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 90 (1989), S. 7550-7555 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We demonstrate the use of the atomic force microscope (AFM) for studying perfluoropolyether polymer liquid films as thin as ∼20 A(ring). With the AFM we are able to measure three distinct properties of the liquid film: (1) its thickness when the thickness of liquid on the AFM tip is taken into account, (2) the meniscus force acting on the AFM tip as a function of depth into the liquid film, and (3) the topography of the liquid/air interface. All three of these measurements can be done with a very high lateral resolution, ∼1000 A(ring), demonstrating the unique capability of AFM for studying liquid films. With AFM we have observed several interesting properties of these polymeric liquid films. First films thinner than ∼300 A(ring) are fairly uniformly distributed, while films thicker than ∼300 A(ring) slowly dewet the surface. Second, by measuring the meniscus radius of liquid in a micron sized hole on the surface, we can determine the disjoining pressure in a thin liquid film.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 5315-5321 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The mechanical and tribological characteristics of thin chromium oxide films are investigated by controlling the process parameters in reactive deposition and subsequent annealing. From this, the correlation between the deposition process, film structure, and properties is established. Substrate heating and oxygen partial pressure are found to be the critical parameters that alter the oxygen concentration and crystallization of the films which, in turn, affect their stress, hardness, and wear resistance. The chromium oxide film deposited at 150 °C in pure argon and annealed at 300 °C shows a hardness of 25 GPa, which is near the bulk hardness of Cr2O3, and exhibits a good wear resistance with adhesive wear being the dominant wear mechanism. Reactive deposition at 25 °C or with excessive oxygen leads to films with nonstoichiometric composition, which hinders their crystallization upon low-temperature annealing. As a result, the hardness is reduced, and the wear resistance deteriorates several orders of magnitude with a concomitant transition of the wear mechanism from adhesive into an abrasive regime.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 5647-5652 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamics of molecularly thin liquid lubricant films in sliding and flying experiments is studied principally by scanning microellipsometry and complemented with both scanning x-ray photoelectron spectroscopy and infrared spectroscopy. Microellipsometric profiling of lubricant thickness is performed in situ, either dynamically or statically on films ranging from 1 to 10 nm. The removal of liquid polyperfluoroether lubricants from sliding and flying tracks, which includes the displacement and loss depends on film thickness, molecular weight, and chemical structure. In flying and sliding, the lubricant removal rate from monolayer films is significantly slower than from multilayer films. In flying, lubricant displacement and loss increase with a decrease in molecular weight.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 2706-2711 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tribological studies of friction and wear were performed on carbon overcoated thin-film magnetic recording media with pin-on-disk tests. Scanning microellipsometry was employed to measure the wear of carbon overcoats on rigid magnetic media. Severe wear produced after the carbon film wore through was measured by mechanical profilometry. The wear rate of the carbon is three orders of magnitude lower than that of the underlying metallic layers and is nearly proportional to slider load. Micrographs of the wear tracks and the magnitude of the wear coefficient from the Archard wear equation indicate three-body abrasive wear.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 52-54 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Perfluoropolyether (PFPE) films for lubrication of thin film magnetic recording media are made progressively thinner and their physical properties are increasingly dominated by molecular interactions with the carbon overcoat. Surface potential measurement is one of a few techniques to study the interaction of ultrathin films with surfaces. A scanning Kelvin probe apparatus with spatial resolution of 100 microns and potential sensitivity of 0.5 mV was employed to study the surface potentials of linear and branched PFPE films with methyl, hydroxyl, phenyl ester, and carboxylic acid end groups on amorphous hydrogenated carbon surfaces. The surface potential is dominated by polar groups rather than the PFPE monomers. Application of the scanning surface potential technique to measure the migration of PFPE films is also shown. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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