Electronic Resource
College Park, Md.
:
American Institute of Physics (AIP)
The Journal of Chemical Physics
92 (1990), S. 3189-3196
ISSN:
1089-7690
Source:
AIP Digital Archive
Topics:
Physics
,
Chemistry and Pharmacology
Notes:
Migration of very thin (〈30 nm) polymeric films on solid surfaces was investigated quantitatively using two techniques—scanning microellipsometry and scanning small spot x-ray photoemission spectroscopy. The surface diffusion coefficient Ds increases as the film thickness decreases down to 1 nm, however, below 1 nm, Ds becomes independent of polymer film thickness. The functional dependence of Ds with molecular weight M is described, over the limited range of M in the unentangled regime, by M−1.7 The activation energy for polymer segment hopping is about 41 kJ/mol, which is similar to values obtained from bulk self-diffusion of other polymers.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.457916
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