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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 899-901 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A self-consistent quantum mechanical simulation is used to study the effect of spacer layer thickness on such resonant tunneling diode properties as the peak current and peak-to-valley current ratio. It is found that with a low cathode doping the peak current is insensitive to the commonly used spacer layer thickness. However, for higher cathode doping the peak current decreases with increasing spacer layer thickness. This phenomenon is explained on the basis of the junction potential between the heavily doped cathode contact region and the undoped double-barrier region. Thus, for device applications where a high current density is desired the cathode spacer layer should be designed as thin as possible.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2631-2633 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of incorporating a spatially variable effective mass in the Schrödinger equation method of resonant tunneling device modeling is investigated. It is shown that inclusion of this effect can produce an order of magnitude difference in the calculated peak current density of the static current voltage (I-V) curve for the resonant tunneling diode. Results for a particular In0.53Ga0.47As-AlAs structure show that much better agreement between theory and experiment is obtained by including this effect. Also, comparison of transient results for an In0.53Ga0.47As-In0.52Al0.48As structure shows a significant change in the diode switching transients.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1533-1540 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Silicon carbide (SiC), due to its thermal and electronic properties, has long been considered an excellent device material for microwave and millimeter-wave power generation. Numerical simulations were performed to study the typical power generating capabilities of SiC impact avalanche transit-time (IMPATT) diodes utilizing the recent experimental data available. Operating characteristics of double-drift IMPATT devices at 10, 35, 60 and 94 GHz are compared. Both pulsed mode and continuous-wave (cw) mode operation are studied. Finally, a comparison among SiC, Si, and GaAs double-drift IMPATT devices is made at various frequencies. It is shown that, for the pulsed mode of operation, SiC double-drift IMPATT devices can produce significantly higher powers than Si and GaAs devices at comparable frequencies. In the cw mode of operation, SiC devices can produce significantly more power than GaAs devices at all frequencies. However, a comparison at 94 GHz indicates that SiC IMPATT diodes in the cw mode of operation produce power levels comparable to Si IMPATT devices. At lower frequencies the performance of SiC diodes operating in the cw mode is expected to be better than the performance of Si devices due to the better thermal conductivity of SiC.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the dependence of the performance characteristics of In0.52 Al0.48As/ In0.53 Ga0.47 As resonant tunneling diodes upon molecular-beam-epitaxial growth parameters. The roughness of the growth front, leading to intrawell-size fluctuations and the V/III flux ratio at a fixed growth temperature are found to be important parameters affecting the performance of these devices. By means of a simple model, we have semiquantitatively related the peak current to the interface roughness. Defects and traps in the In0.52 Al0.48 As barriers, on the other hand, produced partially by nonoptimal V/III flux ratios, may produce shunt paths for tunneling, again reducing the resonant tunneling current peak-to-valley ratio. Under optimum growth conditions we have measured current peak-to-valley ratios of 6.1 and 21.6 at 300 and 77 K, respectively. These are the best values reported so far for this heterostructure system.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 867-869 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a thin graded layer of InGaAs starting on GaAs and becoming InAs on the top, low-resistance alloyed and nonalloyed ohmic contacts have been achieved on n+-GaAs epilayers grown by molecular-beam epitaxy on a semi-insulating GaAs substrate. In addition, by a suitable choice of the multilayer ohmic metals and by an optimization of the alloying process, good surface morphology was obtained. The transmission-line model is used to extrapolate contact resistances from measurements on test patterns with multiple gap spacings varying from 1 to 10 μm. The nonalloyed contact resistance is found to be 0.025 Ω mm for a GaAs layer doped to 1×1018 with a 500-A(ring) graded InGaAs layer. Alloying the contact at 475 °C for 60 s produces a contact resistance of 0.019 Ω mm. This represents a substantial improvement over the contact resistances obtained by just using an ungraded cap layer of InAs on GaAs. Assuming that the sheet resistance under the contact is the same as the sheet resistance in the top semiconductor layer (this is not strictly true), the nominal value of the specific contact resistance for the nonalloyed situation is 5.32×10−7 Ω cm2, while for the alloyed case the specific contact resistance is 2.56×10−7 Ω cm2. The metal scheme used for the contact is Ni/Ge/Au/Ti/Au.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 0038-1101
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 32 (1989), S. 1377-1381 
    ISSN: 0038-1101
    Keywords: Resonant tunneling ; bound state ; hot electrons ; quantum well base ; transistor action
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Surface Science 228 (1990), S. 426-429 
    ISSN: 0039-6028
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    International journal of infrared and millimeter waves 10 (1989), S. 595-620 
    ISSN: 1572-9559
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Oscillations from resonant-tunneling diodes have been observed up to 200 GHz, and theoretical estimates predict that device performance should extend into the THz range. This paper addresses the issue of the ultimate frequency response and power generation capability of these devices. Techniques recently developed to solve the time-dependent Schrödinger equation are used to predict the rf power vs. frequency obtainable from resonant-tunneling diode oscillators, based on the calculated small-signal response. Factors limiting the rf power output from these devices are presented. Also, recently obtained dc experimental results for the In.53Ga.47As-InxAl1-xAs heterostructure material system grown on InP are presented. Using a quasi-static approximation, the rf power available from these devices under large-signal conditions is estimated.
    Type of Medium: Electronic Resource
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