ISSN:
1573-4854
Keywords:
porous silicon
;
four-wave mixing
;
microwave harmonics generation
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract We apply optical contactless techniques, namely the four-wave-mixing and microwave harmonics generation for the characterization of nanocrystalline free-standing films and platelets of microcrystalline porous silicon. We observe (i) full carrier localization and significant lifetime shortening in free-standing films, which is thought to be a manifestation of their low-dimensional confinement, (ii) increased carrier lifetime in microcrystalline porous silicon, presumably originating from passivated surface states at the surface of pores.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1009660820862
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