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  • 1
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 276-277 (Mar. 1998), p. 153-174 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 297-298 (Dec. 1998), p. 265-270 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 10 (1988), S. 57-69 
    ISSN: 0392-6737
    Keywords: Thin-film growth ; structure and epitaxy
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Films di solfuro di cadmio sono stati cresciuti su substrati di tellururo di cadmio, mediante la tecnica della deposizione chimica da fase vapore in tubo aperto. La crescita è stata realizzata in un reattore di tipo orizzontale, usando come sorgente grani policristallini di CdS e idrogeno come agente trasportatore. Le temperature della zona sorgente e della zona substrato sono state variate nell'intervallo (700÷900)°C e (400÷800)°C, rispettivamente. I valori sperimentali della velocità di crescita sono stati paragonati a quelli calcolati assumendo un modello di crescita in condizioni di quasi equilibrio. Il confronto mostra che il processo di crescita può essere adeguatamente descritto da tale modello in un piccolo intervallo di temperatura attorno a 700°C. A temperature inferiori o superiori le cinetiche superficiali limitano la crescita. I films cresciuti a 700°C mostrano inoltre la migliore morfologia. Misure di diffrazione X e di fotoluminescenza evidenziano inoltre che i films cresciuti in queste condizioni hanno una buona qualità strutturale.
    Abstract: Резюме Метод химического напыления в открытой тпубке испольэуется для выращивания эпитаксиальных CdS пленок на CdTe подложках. Выращивание проиэводится в гориэонтальном реакторе, испольэуя поликристаллический CdS в качестве материала источника и водород, как транспортный гаэ. Температуры эоны источника и эоны подложки иэменяются соответсвенно в интервалаш (700÷900)°C и (400÷800)°C. Экспериментальные значения напыления сравниваются с вычисленными значениями, предполагая квази-равновесныю модель. Сравнение показывает, что выращивания мжет быть адекватно описан с помощью такой модели в небодьшой области температур вблиэи 700°C. При меньших и больших температурах поверхностная кинетика ограничивает процесс роста. Пленки, выращенные при 700°C, также овнаруживает наилучшую морфологию. Иэмерения рентгеновской дифракции и фотолюминиесценции подтверждают, что пленки, выращенные в этих условиях, имеУт высокое качество структуры.
    Notes: Summary The open-tube chemical vapour deposition has been used to grow epitaxial CdS films on CdTe substrates. The growth has been performed in a horizontal reactor, using polycristalline CdS as source material and hydrogen as transporting gas. The deposition and the source temperatures have been varied in the range (400÷800)°C and (700÷900)°C, respectively. The experimental values of the deposition rate have been compared with those calculated assuming a quasi-equilibrium model. The comparison shows that the growth process can be adequately described by such a model in a small-temperature region around 700°C. At lower or higher temperatures the surface kinetics becomes the limiting mechanism. Films grown at 700°C show also the best morphology. X-ray diffraction and photoluminescence measurements evidence that films grown in these conditions have a good structural quality.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 359-361 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The Stransky–Krastanow metalorganic vapor phase epitaxy growth of self-organized ZnTe islands on homoepitaxial (001)GaAs is demonstrated. The −7.4% lattice mismatch of the ZnTe/GaAs heterostructure leads to a strain-driven distribution of nanoscale ZnTe islands on top of a two-dimensionally (2D) grown wetting layer. Atomic force microscopy and Rutherford backscattering spectrometry are used to determine the island dimensions and the thickness of the wetting layer. The density of the islands, their average diameter, and aspect ratio turn out to be about 520 μm−2, 13.6 nm, and 0.20, respectively, for a 1.2 ML thick 2D layer. Furthermore, the average aspect ratio of the islands decreases by increasing the thickness of the wetting layer, as expected by the progressive extinction of the strain-driven island nucleation. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 2429-2434 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structural characterization of ZnS epilayers grown by hydrogen transport vapor-phase epitaxy on (100)-oriented GaAs substrates is reported. X-ray-diffraction measurements in both double-axis (DA) and single-axis modes were performed to determine the residual strain tensor and the strain temperature dependence of the epilayer in the range between 25 and 650 °C. From the analysis of the data obtained by DA measurements of several symmetric Bragg reflections at different azimuth angles and several asymmetric reflections recorded in different geometries, an orthorhombic distortion of the ZnS lattice was found. The crystallographic symmetry could be explained by an asymmetric distribution of the misfit dislocation density in the interface plane along the [011] and [01¯1] directions. The temperature dependence measurements of the strain tensor components between room temperature and the growth temperature (650 °C) allowed determination of the thermal misfit between ZnS and GaAs and the linear thermal-expansion coefficient of ZnS. Finally, triple-crystal diffractometry and secondary-ion-mass spectrometry were used to investigate the chemical nature of the ZnS-GaAs interface. The results indicate the presence of an interdiffused ZnS-GaAs interface region, whose occurrence turns out to be associated with the initial defect structure of the substrate surface before the growth. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The metalorganic vapor phase epitaxy growth of ZnTe by di-isopropyl-telluride and di-methyl-zinc (Me2Zn) precursors is investigated by studying the epilayer growth rate as a function of both growth temperature and precursor transport rates. The ZnTe growth is a thermally activated process involving the heterogeneous pyrolysis of both Zn and Te alkyls onto the ZnTe surface. The growth rate dependence on growth conditions is explained in terms of surface adsorption-desorption reactions, assuming that the incorporation of Zn and Te atoms into ZnTe takes place through their selective adsorption on different surface lattice sites. There is also evidence that the occurrence of a competitive species for the surface adsorption of Zn atoms, which is identified as the CH3⋅ (methyl) radical, is produced by the pyrolysis of Me2Zn. Photoluminescence (PL) and absorption measurements performed on ZnTe allow to identify two new donor-acceptor pair (DAP) bands, originated from the recombination of a Ga donor with two acceptor centers, whose ionization energies are 56 meV for the higher energy band and around 140–150 meV for the lower energy one. Hall measurements show that the 56 meV acceptor is responsible of the p-type conductivity of the layers. The nature of the impurities originating such PL features is discussed with the support of secondary ion mass spectrometry. It is shown that Ga, Si, and C are dominant impurities in the layers, whereas Cu does not occur in our ZnTe. Unintentional C doping occurs in ZnTe as a consequence of the strong methyl and iso-propyl radical surface adsorption. We show that C is incorporated as an acceptor in ZnTe, originating the DAP bands observed in the PL spectra. Within this view, the 56 meV ionization energy acceptor is tentatively assigned to substitutional C atoms on Te lattice sites. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structural characterization of ZnTe epilayers grown on (100)GaAs by metalorganic vapor-phase epitaxy is reported. A detailed study of the ZnTe/GaAs heterostructure based on both high-resolution and conventional electron microscopy and ion channeling Rutherford backscattering spectrometry allows correlation of the type and spatial distribution of the extended defects occurring at or close to the ZnTe/GaAs interface with the amount of residual lattice strain into the ZnTe epilayers. Both pure edge Lomer and 60°-mixed misfit dislocations were identified at the interface along with partial dislocations bounding stacking faults, their overall density and distance distribution indicating the occurrence of a residual compressive strain at the heterostructure interface. By comparing this interface strain to the corresponding surface value of the same samples the occurrence of an inhomogeneous strain relaxation along the growth direction is clearly demonstrated. It is shown that such a strain gradient should be entirely ascribed to threading dislocations occurring into the ZnTe epilayers, their distribution being strictly correlated to the amount of residual strain along the epilayer growth direction. The conclusions are further supported by the analysis of the ZnTe surface strain, whose dependence on the epilayer thickness is consistent with that expected on the basis of a phenomenological model for the epilayer residual strain relaxation by threading dislocations. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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