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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 5940-5940 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effects of a magnetic underlayer on the magnetic behavior of overlayer/underlayer combinations were investigated. Permalloy underlayers of 100 nm thickness and composition 82% Ni-18% Fe by weight were sputter deposited on 3-in.-diam Si substrates. Magnetic orientations of the underlayers were set at 0°, 45°, and 90° with respect to the orientation of a subsequently plated Permalloy (79%Ni-21%Fe overlayer. Several film combinations were generated on each of the various underlayer configurations with plated thicknesses ranging from 0.1 to 2.0 μm. Spatial maps of magnetic orientation and Hk for underlayers and underlayer/overlayer combinations were collected using a modified Kerr BH imager (Kerr BHI) designed from Gudeman.1 The maps covered a 5 cm×5 cm square region with 5 mm spacing between points. Comparison of the maps before and after plating shows a partial reduction in the measured Hk values for film systems with large underlayer/overlayer orientation differences. A uniform decline in the effect of the underlayer to the overall orientation direction as film thicknesses increase was also observed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 3946-3946 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Measurement of the noise spectrum of high performance oxide, thin-film longitudinal and perpendicular rigid recording media have been made in order to establish the frequency dependence of the noise, the intrinsic media signal-to-noise ratio, and the practical recording density limit set by error rate considerations. For the oxide media tested, the noise spectrum was flat with frequency at 0.7 μV rms/100 μV rms signal indicating it was close to the particle size determined noise limit. For plated Co-P and sputtered Co-Re thin-film longitudinal media the noise spectrum increases with frequency. At D70 (18 KFCI) the noise was 1.25 and 1 μV per 100 μV rms signal, respectively. For the vertical media the noise contribution came from shouldering around the fundamental frequency and was 2.5 μV/10 μV rms signal at D70 (22 KFCI) and increased with frequency. The measurements were made with both inductive and magnetoresistive heads (improved sensitivity) at 900 TPI and over a 20-MHz bandwidth. D70 for the oxide media was 13 KFCI. The flying height was maintained at 9μ in. Measurements were made at narrower trackwidths to confirm the square root dependence of S/N on trackwidth. Comparisons of both dc erase and high-frequency noise spectrums are presented and contrasted for oxide and metallic media. Evidence supporting proposed theories for the source of the media noise is discussed and the implications with respect to maximum achievable areal densities (without error correction) are presented.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: As the recording industry increases areal density every year, a magnetoresistive-soft adjacent layer (MR-SAL) head design is desirable with the following qualities: easy to be fabricated in large volume, capable of consistent and stable device-to-device performance, and enough signal to noise ratio to perform at high recording densities and data rates. A new type of MR head with these attributes is described for an areal density equal to 1444 Mb/in.2. The off-track characteristics of this MR head are determined by the sensor edge design which is defined by a permanent magnet (PM) layer. Improved off-track performance was achieved by substituting the spacer layer with the PM outside of the active sensor area. Excellent boundary control stabilization was obtained by the ferromagnetic exchange coupling between the PM and, the SAL and the MR layers. The bit error rate and electrical test results showed acceptable performance at 175 kbpi and 8250 tpi. The above MR head had average values of low frequency amplitude (LFA), PW50, read width and write width equal to 900 μV, 12.4, 72, and 107 μin., respectively. The low frequency symmetry (LFSYM) was 1.1 (Vpos/Vneg) and the position error off-track capability was 26 μin. Finally, the LFA covariance (σ/avg) was found to be 0.22% and the microtrack had no bumps or side lobes. These results indicate that this design and its implementation produce stable heads that can perform on and off track at 1444 Mb/in.2. ©1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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