ISSN:
1572-8986
Keywords:
Negative ions
;
electron attachment
;
dissociative electron attachment
;
negative ion lifetimes
;
time-of-flight mass spectrometry
;
SF6 decomposition products
;
SF6, SF4 SOF2, SO2F2, SOF4, SO2, SiF4
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Technology
Notes:
Abstract Dissociative and nondissociative electron attachment in the electron impact energy range 0–14 eV are reported for SOF2 SOF4, SO2F2, SF4, SO2, and SiF4 compounds which can be formed by electrical discharges in SF6. The electron energy dependences of the mass-identified negative ions were determined in a time-of-flight mass spectrometer. The ions studied include F− and SOF 2 −* from SOF2; SOF 3 − and F− from SOF4; SO2F 2 −* , SO2F−, F 2 − , and F− from SO2F2; SF 4 −* and F− from SF4; O−, SO−, and S− from SO2; and SiF 3 − and F− from SiF4. Thermochemical data have been determined from the threshold energies of some of the fragment negative ions. Lifetimes of the anions SOF 2 −* , SO2F 2 −* , and SF 4 −* are also reported.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01447168
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