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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 86 (1982), S. 533-537 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 2103-2105 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Improvement in detection sensitivity of S2F10 in SF6 down to concentrations below 10 parts per billion, using a cryogenic enrichment-gas chromatography technique, has permitted the detection of S2F10 produced by a single-spark discharge in SF6. The spark yield of S2F10 was found to fall in the range of yields found in earlier work on more highly decomposed SF6. Based on preliminary data the spark discharge may provide a suitable and reproducible reference source of S2F10.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 98 (1993), S. 9466-9471 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The absolute cross sections for dissociative electron attachment to the molecules S2F10, S2OF10, and S2O2F10 were measured in an electron transmission experiment. The corresponding negative-ion fragments were identified in a separate mass spectrometric measurement. For S2F10, the attachment of thermal electrons (energy less than 0.1 eV) appears to result primarily in the formation of F− and SF5− with possibly a small fraction of SF4− and SF6−. The ions F− and SF5− are also produced from two attachment resonances at electron energies of about 4.5 and 9.5 eV. Both S2OF10 and S2O2F10 have unusually large dissociative attachment cross sections (on the order of 10−12 cm2) at energies near 0.1 eV. Electron attachment to S2OF10 yields primarily SOF5−, while S2O2F10 yields both SF5− and SOF5− with possible minor fractions of F− and SOF3−. Self-consistent-field calculations have been carried out on the neutral molecules and the corresponding anions to aid in the description of the observed dissociative attachment.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 85 (1986), S. 4377-4380 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The rates for gas-phase hydrolysis of SOF2 (thionylfluoride) and SOF4 (thionyl tetrafluoride) have been measured at a temperature of 298 K. The second order rate constant for SOF2 hydrolysis in SF6 buffer gas was found to have the value (1.2±0.3)×10−23 cm3/s which agrees with previous estimates of Sauers et al., but is three orders of magnitude lower than the value obtained by Rüegsegger et al. at 340 K. The rate constant for SOF4 hydrolysis has not previously been measured and its value in both SF6 and N2 buffer gases was found here to be (1.0±0.3)×10−21 cm3/s.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 83 (1985), S. 2618-2619 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The second-order gas phase reaction rate constant for SF4 hydrolysis to SOF2 has been determined by mass spectrometry and found to be in the range (0.9–2.6)×10−19 cm3 s−1 at 350 K. The hydrolysis of SOF2 in the gas phase is 3 to 4 orders of magnitude slower than that of SF4. Since only liquid phase rate constant data exist for SF4 and none for SOF2, our gas phase rate constant for SF4 was extrapolated to liquid H2O density for comparison to the literature and was found to be consistent with the rate constant for complete aqueous hydrolysis of SF4, which was indirectly determined by the conductivity change in a pulse radiolysis study of SF6 in aqueous solution. The agreement between these values provides direct support for the conclusion of the pulse radiolysis study, namely, that the rate-determining step involves water attack on SF4. The present data further indicate that SOF2 cannot be an intermediate in the aqueous hydrolysis of SF4. A reaction is proposed for both gaseous and liquid phase hydrolyses which involve a common intermediate.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 84 (1986), S. 239-243 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The total rate constant ka(〈ε〉,T) for dissociative electron attachment to SO2 has been measured as a function of the mean electron energy 〈ε〉 (1.9–4.8 eV) and temperature T (300–700 K) using an electron swarm technique. From the measured ka(〈ε〉,T), the total electron attachment cross sections σda(ε,T) were determined. The peak value (at ∼4.5 eV) of σda increases by more than a factor of 2 when T is increased from 300 to 700 K, but the peak position and onset of σda shift to lower energy only slightly, indicating a dissociative attachment process with a vertical onset. The magnitude of σda(ε,T(approximately-equal-to)300 K) was also determined in a time-of-flight mass spectrometric study. These measurements resolve the existing disparity in the literature concerning the magnitude of σda(ε) for this molecule.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Analytica Chimica Acta 135 (1960), S. 179-192 
    ISSN: 0003-2670
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Chemical Physics Letters 81 (1981), S. 528-530 
    ISSN: 0009-2614
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 8 (1988), S. 225-246 
    ISSN: 1572-8986
    Keywords: Corona discharges ; chemical reactions ; rate coefficients ; experimental
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract The temperature (T) and electric field-to-gas pressure (E/P) dependences of the rate coefficientk for the reaction SF 6 − +SOF4→SOF 5 − +SF5 have been measured. ForT〈270 K,k approaches a constant of 2.1×10−9 cm3/s, and for 433〉T〉270 K,k decreases withT according tok (cm3/s)=0.124 exp [−3.3 lnT(K)]. ForE/P〈V/cm·torr,k has a constant value of about 2.5×10−10 cm3/s, and for 130 V/cm·torr〉E/P〉60 V/cm·torr, the rate is approximately given byk (cm3/s)∼7.0×10−10 exp (−0.022E/P). The measured rate coefficient is used to estimate the influence of this reaction on SOF4 production from negative, point-plane, glow-type corona discharges in gas mixtures containing SF6 and at least trace amounts of O2 and H2O. A chemical kinetics model of the ion-drift region in the discharge gap is used to fit experimental data on SOF4 yields assuming that the SF 6 − +SOF4 reaction is the predominant SOF4 loss mechanism. It is found that the contribution of this reaction to SOF4 destruction falls considerably below the estimated maximum effect assuming that SF 6 − is the predominant charge carrier which reacts only with SOF4. The results of this analysis suggest that SF 6 − is efficiently deactivated by other reactions, and the influence of SF 6 − +SOF4 on SOF4 production is not necessarily more significant than that of other slower secondary processes such as gas-phase hydrolysis.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 13 (1993), S. 17-35 
    ISSN: 1572-8986
    Keywords: Negative ions ; electron attachment ; dissociative electron attachment ; negative ion lifetimes ; time-of-flight mass spectrometry ; SF6 decomposition products ; SF6, SF4 SOF2, SO2F2, SOF4, SO2, SiF4
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Dissociative and nondissociative electron attachment in the electron impact energy range 0–14 eV are reported for SOF2 SOF4, SO2F2, SF4, SO2, and SiF4 compounds which can be formed by electrical discharges in SF6. The electron energy dependences of the mass-identified negative ions were determined in a time-of-flight mass spectrometer. The ions studied include F− and SOF 2 −* from SOF2; SOF 3 − and F− from SOF4; SO2F 2 −* , SO2F−, F 2 − , and F− from SO2F2; SF 4 −* and F− from SF4; O−, SO−, and S− from SO2; and SiF 3 − and F− from SiF4. Thermochemical data have been determined from the threshold energies of some of the fragment negative ions. Lifetimes of the anions SOF 2 −* , SO2F 2 −* , and SF 4 −* are also reported.
    Type of Medium: Electronic Resource
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