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  • 1
    Electronic Resource
    Electronic Resource
    Electron attachment to chromium hexacarbonyl at threshold energies (1984)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 106 (1984), S. 823-824 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja00315a078
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  • 2
    Electronic Resource
    Electronic Resource
    Laser desorption time-of-flight mass spectrometry of low-molecular-weight polymers (1986)
    s.l. : American Chemical Society
    Macromolecules 19 (1986), S. 2996-3001 
    Details
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ma00166a021
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  • 3
    Electronic Resource
    Electronic Resource
    Electronic excitation and .pi.-electron interaction in borazine (1986)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 108 (1986), S. 3602-3608 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja00273a009
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  • 4
    Electronic Resource
    Electronic Resource
    Collisional electron detachment and decomposition cross sections for SF−6, SF−5, and F− on SF6 and rare gas targets (1989)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 91 (1989), S. 2254-2260 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute total cross sections for collisional electron detachment and collision-induced dissociation (CID) have been measured for binary collisions of SF−6 and SF−5 with rare gas and SF6 targets for laboratory collision energies ranging from about 10 up to 500 eV. The cross sections for electron detachment of SF−6 are found to be surprisingly small, especially for the SF6 target, for relative collision energies below several tens of electron volts. Specifically, detachment onsets are found to occur at around 30 and 90 eV for the rare gas and SF6 targets, respectively. The CID channel which leads to F− as a product is observed to dominate detachment for relative collision energies below 100 eV. The results for the SF−5 projectile are remarkably similar to those exhibited for SF−6. The role of long-lived excited states in the reactant SF6 ion beam is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.457033
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  • 5
    Electronic Resource
    Electronic Resource
    Collisional electron detachment and decomposition rates of SF−6, SF−5, and F− in SF6: Implications for ion transport and electrical discharges (1989)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 91 (1989), S. 2261-2268 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Measured cross sections for prompt collisional detachment and decomposition of SF−6, SF−5, and F− in SF6 reported in the preceding companion paper are used to calculate detachment coefficients and ion-conversion reaction coefficients as functions of electric field-to-gas density ratio (E/N) for ion drift in SF6. Analysis from a model presented here using these coefficients suggests that prompt electron detachment from SF−6 and SF−5 in SF6 are insignificant processes in such ion-drift experiments. Calculated rates for ion-conversion processes indicate the necessity to: (1) reexamine the previously measured rates in SF6 from drift-tube experiments, and (2) use ion kinetic-energy distributions with larger high-energy tails than the standard distributions assumed in earlier calculations. The calculated detachment and reaction coefficients are used in a model which invokes detachment from long-lived energetically unstable states of collisionally excited SF−6 to explain the pressure dependence of previously measured detachment coefficients and the high detachment thresholds implied by analysis of electrical-breakdown probability data for SF6. Consistent with the interpretation of results from earlier work, the model indicates that at high pressure, measured detachment coefficients depend primarily upon rates for ion conversion and prompt collisional detachment from F−.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.457646
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  • 6
    Electronic Resource
    Electronic Resource
    Anion states of η4-polyene iron tricarbonyl complexes (1987)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 87 (1987), S. 7001-7006 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Attachment energies of low energy electrons to Fe(CO)5 and to η4 complexes of 1,3-butadiene, 1,3-cyclohexadiene, cyclooctatetraene, and cyclobutadiene with Fe(CO3) have been determined by electron transmission spectroscopy. The spectrum of Fe(CO)5 is similar to that of Cr(CO)6, showing an anion resonance near threshold assigned to predominantly Fe3d orbitals and two resonances between 1 and 3 eV assigned to predominantly COπ* orbitals.The diene complexes show threshold features similar to Fe(CO)5, COπ* resonances around 2 eV, and one or more diene π* resonances. The resonances from the lowest π* orbitals of butadiene, cyclohexadiene, and cyclooctatetraene are little different in the free dienes and the complexes, but higher π* orbitals are substantially destabilized in the complexes, consistent with qualitative symmetry arguments. In the cyclobutadiene complex the π@B|3 orbital of cyclobutadiene is strongly destabilized by interaction with the Fe3d, giving a resonant feature at 1.2 eV. Dissociative attachment of electrons by the iron tricarbonyl complexes has been observed mass spectrometrically. The phenomenon is observed for electrons of energy less than 2 eV and results primarily in the loss of CO. For the cyclobutadiene complex, however, the attachment of 0 eV electrons results in a complex chemical process leading to the ejection of C2.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.453397
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  • 7
    Electronic Resource
    Electronic Resource
    Ion kinetic-energy distributions and Balmer-alpha (Hα) excitation in Ar-H2 radio-frequency discharges (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 746-757 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Excited neutrals and fast ions produced in a 13.56 MHz radio-frequency discharge in a 90% argon −10% hydrogen gas mixture were investigated, respectively, by spatially and temporally resolved optical emission spectroscopy, and by mass-resolved measurements of ion kinetic energy distributions at the grounded electrode. The electrical characteristics of the discharge were also measured and comparisons are made with results obtained for discharges in pure H2 under comparable conditions. Measurements of Balmer-alpha (Hα) emission show Doppler-broadened emission that is due to the excitation of fast atomic hydrogen neutrals formed from ion neutralization processes in the discharge. Temporally and spatially resolved emission profiles of the Hα radiation from the Ar-H2 mixture are presented for the "slow'' component produced predominately by electron-impact dissociative excitation of H2, and for the "fast'' component corresponding to energies much greater than can be derived from dissociative excitation. For the Ar-H2 mixture, the fast component is significantly enhanced relative to the slow component. The measured kinetic-energy distributions and fluxes of predominant ions in the Ar-H2 mixture, such as H3+, H2+, H+, and ArH+, suggest mechanisms for the formation of fast hydrogen atoms. The interpretation of results indicate that H+ and/or H3+, neutralized and backscattered by collision with the powered electrode, are the likely sources of fast hydrogen atoms that produce Doppler-shifted Hα emission in the discharge. There is also evidence at the highest pressures and voltages of "runaway'' H+ ions formed near the powered electrode, and detected with kinetics energies exceeding 100 eV at the grounded electrode. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360333
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  • 8
    Electronic Resource
    Electronic Resource
    Kinetic-energy distributions of ions sampled from argon plasmas in a parallel-plate, radio-frequency reference cell (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 115-125 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Kinetic-energy distributions are presented for ions sampled from 13.56-MHz discharges in argon in a capacitively-coupled, parallel-plate, Gaseous Electronics Conference (GEC) radio-frequency reference cell. The cell was modified to allow sampling of ions through an orifice in the grounded electrode. Kinetic-energy distributions are presented for Ar+, Ar++, Ar+2, ArH+, and several trace ions for plasma pressures ranging from 1.3 Pa, where ion-atom collisions in the plasma sheath are not important, to 33.3 Pa, where collisions are important. Applied peak-to-peak radio-frequency (rf) voltages of 50, 100, and 200 V were used, and the current and voltage waveforms at the powered electrode were measured. Dependences of the ion fluxes, mean energies, and kinetic-energy distributions on gas pressure and applied rf voltage are interpreted in terms of possible ion-collision processes. The results agree with previously measured kinetic-energy distributions of ions sampled from the side of the plasma through a grounded probe for similar discharge conditions, verifying that ion kinetics are characteristic of the plasma sheath independent of where it is formed [J. K. Olthoff, R. J. Van Brunt, and S. B. Radovanov, J. Appl. Phys. 72, 4566 (1992)].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.355898
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  • 9
    Electronic Resource
    Electronic Resource
    Ion kinetic-energy distributions in argon rf glow discharges (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4566-4574 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Kinetic-energy distributions have been measured for different mass-selected ions sampled from 13.56 MHz rf glow discharges in argon inside a "GEC rf reference cell.'' The electrode geometry of this cell produces an asymmetric discharge and the cell is operated in a pressure regime where ion-molecule collisions in the sheath region of the discharge are significant. Ions are sampled from the side of the plasma perpendicular to the interelectrode axis using an electrostatic energy analyzer coupled to a quadrupole mass spectrometer. Kinetic-energy distributions for Ar+, Ar2+, Ar++, and ArH+ are presented as functions of applied rf voltage, gas pressure, and distance of the mass spectrometer entrance aperture from the edge of the electrodes. The distributions obtained for the sampling orifice placed close enough to the electrodes to allow formation of a sheath in front of the orifice exhibit features similar to those observed previously when sampling ions through the grounded electrode of a parallel-plate reactor. The Ar+ and Ar++ distributions exhibit secondary maxima predicted to result from the formation of low-energy (thermal) ions in the sheath region, such as by charge-exchange and high-energy electron collisions. Kinetic-energy distributions for Ar2+ and ArH+ exhibit no secondary maxima and are peaked at high energies indicative of the sheath potential, and consistent with a formation mechanism involving relatively low-energy collisions in the bulk plasma (glow region).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352110
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  • 10
    Electronic Resource
    Electronic Resource
    Dissociative electron attachment to S2F10, S2OF10, and S2O2F10 (1993)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 98 (1993), S. 9466-9471 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The absolute cross sections for dissociative electron attachment to the molecules S2F10, S2OF10, and S2O2F10 were measured in an electron transmission experiment. The corresponding negative-ion fragments were identified in a separate mass spectrometric measurement. For S2F10, the attachment of thermal electrons (energy less than 0.1 eV) appears to result primarily in the formation of F− and SF5− with possibly a small fraction of SF4− and SF6−. The ions F− and SF5− are also produced from two attachment resonances at electron energies of about 4.5 and 9.5 eV. Both S2OF10 and S2O2F10 have unusually large dissociative attachment cross sections (on the order of 10−12 cm2) at energies near 0.1 eV. Electron attachment to S2OF10 yields primarily SOF5−, while S2O2F10 yields both SF5− and SOF5− with possible minor fractions of F− and SOF3−. Self-consistent-field calculations have been carried out on the neutral molecules and the corresponding anions to aid in the description of the observed dissociative attachment.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.464378
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