Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
65 (1994), S. 3657-3660
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An automated version of a spectroscopic ac null ellipsometer is described. By simultaneous variation of the angle of incidence and the polarizer azimuth, circular polarization of the reflected radiation can be obtained for any sample configuration. This state of polarization is checked by a rotating analyzer detector system with lock-in technique, thus achieving the highest precision that is theoretically possible. The experimental details including the minimization routine (simplex method) are presented. First experiences gained with dielectric function spectra of InP show the high reproducibility and accuracy of the arrangement. From numerically calculated second derivatives the energy and type of critical interband points are determined. © 1994 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144487
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