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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 1998-2001 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Positron-annihilation lifetime and positron-annihilation Doppler-broadening (PADB) spectroscopies have been employed to investigate the formation of vacancy-type compensation defects in n-type undoped liquid encapsulated Czochrolski grown InP, which undergoes conduction-type conversions under high temperature annealing. N-type InP becomes p-type semiconducting by short time annealing at 700 °C, and then turns into n-type again after further annealing but with a much higher resistivity. Long time annealing at 950 °C makes the material semi-insulating. Positron lifetime measurements show that the positron average lifetime τav increases from 245 ps to a higher value of 247 ps for the first n-type to p-type conversion and decreases to 240 ps for the ensuing p-type to n-type conversion. The value of τav increases slightly to 242 ps upon further annealing and attains a value of 250 ps under 90 h annealing at 950 °C. These results together with those of PADB measurements are explained by the model proposed in our previous study. The correlation between the characteristics of positron annihilation and the conversions of conduction type indicates that the formation of vacancy-type defects and the progressive variation of their concentrations during annealing are related to the electrical properties of the bulk InP material. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 3931-3933 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Unlike its conventional applications in lattice defect characterization, positron annihilation lifetime technique was applied to study temperature-dependent deep level transients in semiconductors. Defect levels in the band gap can be determined as they are determined by conventional deep level transient spectroscopy (DLTS) studies. The promising advantage of this application of positron annihilation over the conventional DLTS is that it could further extract extra microstructure information of deep-level defects, such as whether a deep level defect is vacancy related or not. A demonstration of EL2 defect level transient study in GaAs was shown and the EL2 level of 0.82±0.02 eV was obtained by a standard Arrhenius analysis, similar to that in conventional DLTS studies. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 1889-1892 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Variable energy positron beam and positron annihilation lifetime experiments have been carried out to study the DX center in Cd0.8Zn0.2Te:Cl at 50 K. A short positron effective diffusion length of 275±25 Å and a large intensity of 79.0%±0.3% for the long lifetime component indicate a strong trapping effect at DX centers. A trapping rate of κ=1.53±0.05×109 s−1 and a positron lifetime of 335±2 ps at the DX center were obtained. The concentration of DX centers is found to be 5.9±0.7×1016 cm−3, which is in good agreement with the results obtained using Hall effect and thermo-electric effect measurements. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1432-0630
    Keywords: 68.35.-p ; 78.70.Bj
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Recent positron lifetime studies made on the Au/GaAs interface with an applied electric field returning a significant fraction of bulk implanted positrons to the interface have revealed the presence of microvoids(≈ 1 nm diameter) at the interface. In this work an attempt has been made to study these microvoids by observing the Doppler broadening on the annihilation radiation coming from them. This is done both by observing theS-parameter as a function of applied bias and by applying the generalized least-squares method to the deconvolution of the annihilation radiation lineshape. The general conclusion is that the Doppler-broadened data are consistent with the majority of positrons trapping into microvoids, probably associated with grain boundaries. The data suggest that these open volume defects are more associated with the Au film rather than the Au-Ga alloyed interfacial region.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1432-0630
    Keywords: 78.70.Bj ; 79.90 ; 72.20.Ht
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Positron lifetime spectroscopy measurements have been carried out for semi-insulating GaAs with applied electric fields in the samples directed towards, and away from the positron injecting contact. The lifetime spectra have been decomposed into two components, the longer of which (≈400 ps) is characteristic of open volume defects at the metal-semiconductor interface through which positrons are injected. The interesting feature of these experiments is the large increase in the intensity of this interface component as the field is directed towards the contact. We show that this increase is caused by a significant fraction of implanted positrons drifting under the influence of a strong electric field produced by a layer of space-charge formed adjacent to the positron injecting contact. The general trend of the intensity variation is well explained by the proposed model. Experiments involving the application of an ac bias to the samples strengthen the suggestion that the space charge region is largely formed from ionized EL2 donors. The results of the present work indicate that semi-insulating GaAs possesses properties that make it a suitable material for the fabrication of a high efficiency (≈10%) room-temperature field-assisted positron moderator. The extraction of positrons from the GaAs substrate into the vacuum through a thin metalization is discussed based upon available positron affinities for the GaAs and various elemental metals. These data suggest that a few monolayers of a strongly electronegative metal such as Au or Pd may allow vacuum emission through quantum tunneling.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1432-0630
    Keywords: PACS: 68.35.-p; 78.70.Bj
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  Recent positron lifetime studies made on the Au/GaAs interface with an applied electric field returning a significant fraction of bulk implanted positrons to the interface have revealed the presence of microvoids (≈ 1 nm diameter) at the interface. In this work an attempt has been made to study these microvoids by observing the Doppler broadening on the annihilation radiation coming from them. This is done both by observing the S-parameter as a function of applied bias and by applying the generalized least-squares method to the deconvolution of the annihilation radiation lineshape. The general conclusion is that the Doppler-broadened data are consistent with the majority of positrons trapping into microvoids, probably associated with grain boundaries. The data suggest that these open volume defects are more associated with the Au film rather than the Au-Ga alloyed interfacial region.
    Type of Medium: Electronic Resource
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